Europe’s pilot line for advanced packaging and heterogeneous integration of electronic components and systems (APECS)

Patrick R. Bressler, Michael Töpper, Peter Ramm
{"title":"Europe’s pilot line for advanced packaging and heterogeneous integration of electronic components and systems (APECS)","authors":"Patrick R. Bressler, Michael Töpper, Peter Ramm","doi":"10.1038/s44287-024-00134-6","DOIUrl":null,"url":null,"abstract":"The European Chips Act of 2022 calls for European microelectronics pilot lines to develop and validate novel design and fabrication technologies for next-generation microelectronic chips. Fundamental for new electronic components and systems, advanced packaging and heterogeneous integration technologies are the focus of the APECS pilot line.","PeriodicalId":501701,"journal":{"name":"Nature Reviews Electrical Engineering","volume":"2 1","pages":"4-5"},"PeriodicalIF":0.0000,"publicationDate":"2025-01-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nature Reviews Electrical Engineering","FirstCategoryId":"1085","ListUrlMain":"https://www.nature.com/articles/s44287-024-00134-6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

The European Chips Act of 2022 calls for European microelectronics pilot lines to develop and validate novel design and fabrication technologies for next-generation microelectronic chips. Fundamental for new electronic components and systems, advanced packaging and heterogeneous integration technologies are the focus of the APECS pilot line.
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欧洲先进封装和异质集成电子元件和系统(APECS)试点线
《2022年欧洲芯片法案》要求欧洲微电子试验线开发和验证下一代微电子芯片的新设计和制造技术。新电子元件和系统的基础,先进的封装和异构集成技术是APECS试点线的重点。
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