"Nano-In-Nano" Schottky Diodes Fabricated by Combining Self-Aligned Nanogap Patterning with Bottom-Up ZnO Nanowire Growth.

IF 4.7 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2025-01-02 eCollection Date: 2025-01-14 DOI:10.1021/acsaelm.4c01609
Umer Farooq Ahmed, Gwenhivir S Wyatt-Moon, Andrew J Flewitt
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Abstract

Nanoscale semiconductors offer significant advantages over their bulk semiconductor equivalents for electronic devices as a result of the ability to geometrically tune electronic properties, the absence of internal grain boundaries, and the very low absolute number of defects that are present in such small volumes of material. However, these advantages can only be realized if reliable contacts can be made to the nanoscale semiconductor using a scalable, low-cost process. Although there are many low-cost "bottom-up" techniques for directly growing nanomaterials, the fabrication of contacts at the nanoscale usually requires expensive and slow techniques like e-beam lithography that are also hard to scale to a level of throughput that is required for commercialization. A scalable method of fabricating such devices is demonstrated in this work by combining two bottom-up fabrication techniques. ZnO nanowire Schottky diodes are produced with a device length of a few tens of nanometers and a performance significantly exceeding a ZnO thin film equivalent. The first technique is adhesion lithography that allows self-aligned coplanar electrodes of different materials to be patterned with a nanogap ∼10 to 50 nm length between the two. In this case, one electrode is gold, while the other is a bilayer of titanium on a thin film of ZnO, and it is this thin film that allows the second technique, hydrothermal growth, to be used to grow ZnO nanowires directly across the nanogap. The resulting "nano-in-nano" Schottky diodes have a high rectification ratio >104, a low turn-on voltage <0.3 V, and a minimal off-state current <10 pA. This process could be used to realize a variety of nano-in-nano electronic devices in the future, including short channel gate-all-around (GAA) transistors.

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结合自对准纳米间隙图和自下而上ZnO纳米线生长制备“纳米中纳米”肖特基二极管。
纳米级半导体在电子器件上具有显著的优势,因为它具有几何调谐电子特性的能力,没有内部晶界,而且在如此小体积的材料中存在的缺陷的绝对数量非常低。然而,这些优势只有在使用可扩展的低成本工艺与纳米级半导体进行可靠接触时才能实现。虽然有许多低成本的“自下而上”的技术可以直接生长纳米材料,但在纳米尺度上制造触点通常需要昂贵而缓慢的技术,如电子束光刻,这些技术也很难扩展到商业化所需的产量水平。通过结合两种自下而上的制造技术,在这项工作中展示了一种可扩展的制造这种设备的方法。ZnO纳米线肖特基二极管的器件长度为几十纳米,其性能大大超过等效的ZnO薄膜。第一种技术是附着光刻,它允许不同材料的自对准共面电极在两者之间形成纳米间隙~ 10到50纳米的图案。在这种情况下,一个电极是金,而另一个电极是ZnO薄膜上的双层钛,正是这种薄膜允许第二种技术,水热生长,用于直接在纳米间隙上生长ZnO纳米线。由此产生的“纳米中纳米”肖特基二极管具有高整流比bbb104,低导通电压
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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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Issue Editorial Masthead Issue Publication Information Marking the 100th Issue of ACS Applied Electronic Materials Pushing down the Limit of Ammonia Detection of ZnO-Based Chemiresistive Sensors with Exposed Hexagonal Facets at Room Temperature Direct-Printed Mn–Ni–Cu–O/Poly(vinyl butyral) Composites for Sintering-Free, Flexible Thermistors with High Sensitivity
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