Modeling and Measurement of Lead Tip Heating in Implanted Wires with Loops.

ArXiv Pub Date : 2024-12-19
Lydia J Bardwell Speltz, Seung-Kyun Lee, Yunhong Shu, Matt A Bernstein
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Abstract

Purpose: To theoretically and experimentally study implant lead tip heating caused by radiofrequency (RF) power deposition in different wire configurations that contain loop(s).

Methods: Maximum temperature rise caused by RF heating was measured at 1.5T on 20 insulated, capped wires with various loop and straight segment configurations. The experimental results were compared with predictions from the previously reported simple exponential and the adapted transmission line models, as well as with a long-wavelength approximation.

Results: Both models effectively predicted the trends in lead tip temperature rise for all the wire configurations, with the adapted transmission line model showing superior accuracy. For superior/inferior (S/I)-oriented wires, increasing the number of loops decreased the overall heating. However, when wires were oriented right/left (R/L) where the x-component of the electric field is negligible, additional loops increased the overall heating.

Conclusion: The simple exponential and the adapted transmission line models previously developed for, and tested on, straight wires require no additional terms or further modification to account for RF heating in a variety of loop configurations. These results extend the models' usefulness to manage implanted device lead tip heating and provide theoretical insight regarding the role of loops and electrical lengths in managing RF safety of implanted devices.

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植入线圈导线中导线尖端发热的建模与测量。
目的:从理论上和实验上研究射频(RF)功率沉积在包含环路的不同导线结构中引起的植入导线尖端加热。方法:对20根不同回路和直段配置的绝缘包封导线在1.5T下测量射频加热引起的最高温升。实验结果与先前报道的简单指数模型和适应的传输线模型的预测结果以及长波长近似进行了比较。结果:两种模型均能有效预测所有导线配置下引线尖端温升趋势,其中采用的传输线模型精度更高。对于优质/劣质(S/I)定向导线,增加回路数量降低了整体加热。然而,当电线向右/左(R/L)方向时,电场的x分量可以忽略不计,额外的环路增加了整体加热。结论:简单指数和先前为直线开发并在直线上测试的适应传输线模型不需要额外的条款或进一步修改,以考虑各种环路配置中的射频加热。这些结果扩展了模型在管理植入设备引线尖端加热方面的实用性,并提供了关于回路和电长度在管理植入设备射频安全中的作用的理论见解。
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