Point Cloud-Based Deep Learning in Industrial Production: A Survey

IF 23.8 1区 计算机科学 Q1 COMPUTER SCIENCE, THEORY & METHODS ACM Computing Surveys Pub Date : 2025-01-27 DOI:10.1145/3715851
Yi Liu, Changsheng Zhang, Xingjun Dong, Jiaxu Ning
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引用次数: 0

Abstract

With the rapid development of 3D acquisition technology, point clouds have received increasing attention. In recent years, point cloud-based deep learning has been applied to various industrial scenarios, promoting industrial intelligence. However, there is still a lack of review on the application of point cloud-based deep learning in industrial production. To bridge this gap and inspire future research, this paper provides a review of current point cloud-based deep learning methods applied to industrial production from the perspective of different application scenarios, including pose estimation, defect inspection, measurement and estimation, etc. Considering the real-time requirement of industrial production, this paper also summarizes real-time point cloud-based deep learning methods in each application scenario. Then, this paper introduces commonly used evaluation metrics and public industrial point cloud datasets. Finally, from the aspects of the dataset, speed and industrial product specificity, the challenges faced by current point cloud-based deep learning methods in industrial production are discussed, and future research directions are prospected.
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来源期刊
ACM Computing Surveys
ACM Computing Surveys 工程技术-计算机:理论方法
CiteScore
33.20
自引率
0.60%
发文量
372
审稿时长
12 months
期刊介绍: ACM Computing Surveys is an academic journal that focuses on publishing surveys and tutorials on various areas of computing research and practice. The journal aims to provide comprehensive and easily understandable articles that guide readers through the literature and help them understand topics outside their specialties. In terms of impact, CSUR has a high reputation with a 2022 Impact Factor of 16.6. It is ranked 3rd out of 111 journals in the field of Computer Science Theory & Methods. ACM Computing Surveys is indexed and abstracted in various services, including AI2 Semantic Scholar, Baidu, Clarivate/ISI: JCR, CNKI, DeepDyve, DTU, EBSCO: EDS/HOST, and IET Inspec, among others.
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