Extracting the Temperature Dependence of Both Nanowire Resistivity and Junction Resistance from Electrical Measurements on Printed Silver Nanowire Networks.

IF 4.7 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2025-01-09 eCollection Date: 2025-01-28 DOI:10.1021/acsaelm.4c01965
Emmet Coleman, Adam Kelly, Cian Gabbett, Luke Doolan, Shixin Liu, Neelam Yadav, Jagdish K Vij, Jonathan N Coleman
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Abstract

Printed networks of nanoparticles (e.g., nanodots, nanowires, nanosheets) are important for a range of electronic, sensing and energy storage applications. Characterizing the temperature dependence of both the nanoparticle resistivity (ρNW) and interparticle junction resistance (R J) in such networks is crucial for understanding the conduction mechanism and so for optimizing network properties. However, it is challenging to extract both ρNW and R J from standard electrical measurements. Here, using silver nanowires (AgNWs) as a model system, we describe a broadly applicable method to extract both parameters from resistivity measurements on nanowire networks. We achieve this by combining a simple theoretical model with temperature-dependent resistivity measurements on sets of networks fabricated from nanowires of different lengths. As expected, our results demonstrate that R J is the predominant bottleneck for charge transport within these networks, with R NW/R J in the range 0.03-0.7. We demonstrate that the temperature dependence of ρNW exhibits characteristic Bloch-Grüneisen behavior, yielding a Debye temperature between 133-181 K, which aligns with reported values for individual nanowires. Likewise, our findings for residual resistivity and electron-phonon coupling constants closely match published values measured on individual nanowires. The junction resistance also follows Bloch-Grüneisen behavior with similar parameters, indicating the junctions consist of metallic silver. These findings confirm the validity of our method and provide a deeper insight into the conduction mechanisms in AgNW networks. They also pave the way toward simultaneous measurement of ρNW and R J in other important systems, notably carbon nanotube networks.

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从印刷银纳米线网络的电测量中提取纳米线电阻率和结电阻的温度依赖性。
纳米颗粒的印刷网络(例如,纳米点,纳米线,纳米片)对于一系列电子,传感和能量存储应用非常重要。表征这种网络中纳米粒子电阻率(ρNW)和粒子间结电阻(R J)的温度依赖性对于理解传导机制和优化网络性能至关重要。然而,从标准电测量中提取ρNW和R J是具有挑战性的。本文以银纳米线(AgNWs)为模型系统,描述了一种广泛适用的方法,从纳米线网络的电阻率测量中提取这两个参数。我们通过将简单的理论模型与由不同长度的纳米线制成的网络的温度相关电阻率测量相结合来实现这一目标。正如预期的那样,我们的结果表明,rj是这些网络中电荷传输的主要瓶颈,rnw / rj在0.03-0.7之间。我们证明了ρNW的温度依赖性表现出特征的bloch - grisen行为,产生133-181 K之间的德拜温度,这与单个纳米线的报告值一致。同样,我们对剩余电阻率和电子-声子耦合常数的研究结果与发表的在单个纳米线上测量的值非常吻合。结电阻也遵循具有相似参数的布洛赫-格拉尼森行为,表明结由金属银组成。这些发现证实了我们方法的有效性,并为AgNW网络的传导机制提供了更深入的了解。他们还为在其他重要系统中同时测量ρNW和R J铺平了道路,特别是碳纳米管网络。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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