Nicolò Bellarmino;Riccardo Cantoro;Sophie M. Fosson;Martin Huch;Tobias Kilian;Ulf Schlichtmann;Giovanni Squillero
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引用次数: 0
Abstract
In safety-critical applications, microcontrollers must meet stringent quality and performance standards, including the maximum operating frequency $F_{\max}$. Machine learning models have proven effective in estimating $F_{\max}$ by utilizing data from on-chip ring oscillators. Previous research has shown that increasing the number of ring oscillators on board can enable the deployment of simple linear regression models to predict $F_{\max}$. However, the scarcity of labeled data that characterize this context poses a challenge in managing high-dimensional feature spaces; moreover, a very high number of ring oscillators is not desirable due to technological reasons. By modeling $F_{\max}$ as a linear combination of the ring oscillators’ values, this paper employs Compressed Sensing theory to build the model and perform feature selection, enhancing model efficiency and interpretability. We explore regularized linear methods with convex/non-convex penalties in microcontroller performance screening, focusing on selecting informative ring oscillators. This permits reducing models’ footprint while retaining high prediction accuracy. Our experiments on two real-world microcontroller products compare Compressed Sensing with two alternative feature selection approaches: filter and wrapped methods. In our experiments, regularized linear models effectively identify relevant ring oscillators, achieving compression rates of up to 32:1, with no substantial loss in prediction metrics.
期刊介绍:
The IEEE Transactions on Computers is a monthly publication with a wide distribution to researchers, developers, technical managers, and educators in the computer field. It publishes papers on research in areas of current interest to the readers. These areas include, but are not limited to, the following: a) computer organizations and architectures; b) operating systems, software systems, and communication protocols; c) real-time systems and embedded systems; d) digital devices, computer components, and interconnection networks; e) specification, design, prototyping, and testing methods and tools; f) performance, fault tolerance, reliability, security, and testability; g) case studies and experimental and theoretical evaluations; and h) new and important applications and trends.