Weak Measurement of the Angular Goos-Hänchen Shift from a Monolayer MoS2 Immersed in a Dielectric Medium

Abstract

Optical beam shifts in two-dimensional crystals have been measured until now on samples deposited on some substrates. In these cases, the reflected beam is the linear superposition of the atomic crystal and the substrate contribution. By immersion of a monolayer MoS₂ in polydimethylsiloxane, a transparent dielectric material, we can measure the light reflected from the two-dimensional material only. In conjunction with a weak measurement amplification scheme, this allows us to observe for the first time the role of the out-of-plane susceptibility on the angular Goos-Hänchen shift from a two-dimensional material.