Feature knowledge distillation-based model lightweight for prohibited item detection in X-ray security inspection images

IF 9.9 1区 工程技术 Q1 COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE Advanced Engineering Informatics Pub Date : 2025-05-01 Epub Date: 2025-01-25 DOI:10.1016/j.aei.2025.103125
Yu Ren , Lun Zhao , Yongtao Zhang , Yiyao Liu , Jinfeng Yang , Haigang Zhang , Baiying Lei
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Abstract

The detection of prohibited items is an extremely time-sensitive task, yet the complex convolutional neural network (CNN) model has a slow inference speed, which is not conducive to deployment and application in actual security inspection scenarios. Knowledge distillation is a key technology for improving the performance of lightweight models. However, most knowledge distillation methods do not perform differentiated distillation of the foreground and background. In addition, the structural misalignment in heterogeneous networks hinders the effective transfer of knowledge. These factors limit the generalization of knowledge distillation in X-ray image analysis. To solve these problems, we propose a method based on feature knowledge distillation, called XFKD, which aims to improve the detection performance of lightweight models for prohibited items in X-ray images. Specifically, XFKD consists of Local Distillation (LD) and Global Distillation (GD). LD uses mask attention to guide the student network to focus on key knowledge, enhancing its learning capacity. GD learns and reconstructs the relationships between global features from the teacher network, and then transfers to the student network. Furthermore, to weaken the impact of structural differences of heterogeneous networks on knowledge transfer, the features obtained by the teacher network are used as supervised “input” with prior knowledge, not just “target” is transferred to the student network to improve imitation ability. To verify the effectiveness and generalization of XFKD, experiments were carried out on two X-ray security inspection image datasets (SIXray, OPIXray) and COCO datasets. The results show that XFKD performs well in knowledge distillations of various homogeneous and heterogeneous networks, RetinaNet (ResNet101-ResNet50) and YOLOv4 (CSPDarkNet53-MobileNetV3) with XFKD strategy achieve 81. 25% mAP and 76. 32% mAP in the SIXray dataset, which is 7.1% and 1.89% higher than the baseline, respectively. XFKD can improve the detection performance of lightweight models. Our code is available at https://github.com/RY-97/XFKD.
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基于特征知识提取的x射线安检图像违禁物品检测模型轻量化
违禁物品的检测是一项对时间极其敏感的任务,而复杂卷积神经网络(CNN)模型的推理速度较慢,不利于在实际安检场景中的部署和应用。知识蒸馏是提高轻量化模型性能的关键技术。然而,大多数知识蒸馏方法没有对前景和背景进行差异化蒸馏。此外,异质性网络中的结构错位阻碍了知识的有效转移。这些因素限制了知识升华在x射线图像分析中的推广。为了解决这些问题,我们提出了一种基于特征知识蒸馏的XFKD方法,旨在提高轻量化模型对x射线图像中违禁物品的检测性能。具体来说,XFKD由局部蒸馏(LD)和全局蒸馏(GD)组成。LD利用掩模注意力引导学生网络专注于关键知识,增强其学习能力。GD从教师网络中学习并重构全局特征之间的关系,然后转移到学生网络中。此外,为了减弱异构网络结构差异对知识迁移的影响,将教师网络获得的特征作为具有先验知识的监督“输入”,而不仅仅是“目标”转移到学生网络中,以提高模仿能力。为了验证XFKD的有效性和泛化性,分别在SIXray、OPIXray两个x射线安检图像数据集和COCO数据集上进行了实验。结果表明,XFKD在各种同质和异构网络的知识提取中表现良好,采用XFKD策略的retanet (ResNet101-ResNet50)和YOLOv4 (CSPDarkNet53-MobileNetV3)达到81。25% mAP和76。在SIXray数据集中的mAP值为32%,分别比基线高7.1%和1.89%。XFKD可以提高轻量化模型的检测性能。我们的代码可在https://github.com/RY-97/XFKD上获得。
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来源期刊
Advanced Engineering Informatics
Advanced Engineering Informatics 工程技术-工程:综合
CiteScore
12.40
自引率
18.20%
发文量
292
审稿时长
45 days
期刊介绍: Advanced Engineering Informatics is an international Journal that solicits research papers with an emphasis on 'knowledge' and 'engineering applications'. The Journal seeks original papers that report progress in applying methods of engineering informatics. These papers should have engineering relevance and help provide a scientific base for more reliable, spontaneous, and creative engineering decision-making. Additionally, papers should demonstrate the science of supporting knowledge-intensive engineering tasks and validate the generality, power, and scalability of new methods through rigorous evaluation, preferably both qualitatively and quantitatively. Abstracting and indexing for Advanced Engineering Informatics include Science Citation Index Expanded, Scopus and INSPEC.
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