Relationship between Ce3+ 5d1 level, conduction-band bottom, and shallow electron trap level in Gd3Ga5O12:Ce and Gd3Al1Ga4O12:Ce crystals studied via pump-probe absorption spectroscopy

Q2 Engineering Optical Materials: X Pub Date : 2025-02-01 DOI:10.1016/j.omx.2024.100398
Mamoru Kitaura , Heishun Zen , Shinta Watanabe , Hirokazu Masai , Kei Kamada , Kyoung-Jin Kim , Akira Yoshikawa , Jumpei Ueda
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引用次数: 0

Abstract

Ce3+-doped compounds are typically the preferred materials for the development of inorganic phosphors for white LEDs, displays, and scintillators. In this study, pump-probe absorption spectroscopy was performed for Gd3Ga5O12:Ce and Gd3Al1Ga4O12:Ce crystals using ultraviolet (UV) and visible (VIS) pump light, and infrared (IR) probe light. A change in the IR-absorption was observed owing to the generation of free carrier plasma via photoexcitation. Through a simple analysis, the excitation spectra of this change determined the energy at the bottom of the conduction band relative to that at the Ce3+ 4f level. The transient response of the IR-absorption change suggested different relaxation processes for excited electrons in Gd3Ga5O12:Ce and Gd3Al1Ga4O12:Ce. Analysis of the thermally stimulated luminescence (TSL) glow curve determined the trap depth of the electrons in Gd3Al1Ga4O12:Ce. Based on positron annihilation lifetime spectroscopy (PALS), the generation of electron traps was linked to the introduction of vacancy complexes or vacancy aggregates with a negative charge, namely nonstoichiometric compositions. This helps achieve high-quality Ce3+-doped multicomponent oxides.
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通过泵探吸收光谱研究 Gd3Ga5O12:Ce 和 Gd3Al1Ga4O12:Ce 晶体中 Ce3+ 5d1 电平、导带底层和浅电子陷阱电平之间的关系
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来源期刊
Optical Materials: X
Optical Materials: X Engineering-Electrical and Electronic Engineering
CiteScore
3.30
自引率
0.00%
发文量
73
审稿时长
91 days
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