Reciprocal-space mapping calculations of X-ray Laue diffraction in a crystal with thermomigration channels

Abstract

X-ray diffraction in a crystal with lattice strains is studied theoretically using two-dimensional recurrence relations in Laue geometry. Based on these relations, an algorithm for calculating the coherent scattering intensity near a reciprocal-lattice node is developed. Simulation of reciprocal-space mapping was performed for a model of a silicon crystal with Si(Al) thermomigration channels. The change in reciprocal-space maps is shown depending on the strain magnitude in the channel and scanning of the X-ray beam along the input surface of the crystal.