Federated knowledge distillation for enhanced insulator defect detection in resource-constrained environments

IF 1.3 4区 计算机科学 Q4 COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE IET Computer Vision Pub Date : 2024-05-27 DOI:10.1049/cvi2.12290
Xiaohu Huang, Minghui Jia, Xianghua Tai, Wei Wang, Qi Hu, Dongping Liu, Peiheng Guo, Shengxiang Tian, Dequan Yan, Haishan Han
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Abstract

Insulator defect detection is crucial for the stable operation of power systems. It has become a mainstream research direction to realise insulator defect detection based on the combination of line images captured by UAVs and deep learning techniques. However, the existing high-quality insulator defect detection models still face problems such as relying on massive-labelled data and huge model parameters. Especially on resource-constrained devices, it becomes a challenge to strike a balance between model lightweighting and performance. Although the knowledge distillation technique provides a solution for model lightweighting, the loss of information in the distillation process leads to the performance degradation of small models, which in turn creates a paradox between lightweighting and performance. Hence, an insulator defect detection method based on federated knowledge distillation is proposed. The method not only realises the lightweighting of the model, but also effectively improves the model performance by collaboratively training the model through the federated learning approach. Moreover, the asynchronous aggregation approach and model freshness mechanism designed in the method further enhance the training efficiency and collaborative effect. The experimental results show that the detection accuracy and efficiency of this paper's method on public datasets are significantly better than the benchmark algorithm.

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资源受限环境下增强绝缘子缺陷检测的联邦知识精馏
绝缘子缺陷检测对电力系统的稳定运行至关重要。将无人机捕获的直线图像与深度学习技术相结合,实现绝缘子缺陷检测已成为主流研究方向。然而,现有的高质量绝缘子缺陷检测模型仍然面临依赖大量标记数据和庞大模型参数的问题。特别是在资源受限的设备上,如何在模型轻量化和性能之间取得平衡成为一项挑战。虽然知识蒸馏技术为模型轻量化提供了一种解决方案,但是在知识蒸馏过程中信息的丢失会导致小模型的性能下降,从而造成轻量化与性能之间的矛盾。为此,提出了一种基于联邦知识精馏的绝缘子缺陷检测方法。该方法不仅实现了模型的轻量化,而且通过联邦学习方法对模型进行协同训练,有效地提高了模型的性能。此外,该方法设计的异步聚合方法和模型新鲜度机制进一步提高了训练效率和协同效果。实验结果表明,本文方法在公共数据集上的检测精度和效率明显优于基准算法。
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来源期刊
IET Computer Vision
IET Computer Vision 工程技术-工程:电子与电气
CiteScore
3.30
自引率
11.80%
发文量
76
审稿时长
3.4 months
期刊介绍: IET Computer Vision seeks original research papers in a wide range of areas of computer vision. The vision of the journal is to publish the highest quality research work that is relevant and topical to the field, but not forgetting those works that aim to introduce new horizons and set the agenda for future avenues of research in computer vision. IET Computer Vision welcomes submissions on the following topics: Biologically and perceptually motivated approaches to low level vision (feature detection, etc.); Perceptual grouping and organisation Representation, analysis and matching of 2D and 3D shape Shape-from-X Object recognition Image understanding Learning with visual inputs Motion analysis and object tracking Multiview scene analysis Cognitive approaches in low, mid and high level vision Control in visual systems Colour, reflectance and light Statistical and probabilistic models Face and gesture Surveillance Biometrics and security Robotics Vehicle guidance Automatic model aquisition Medical image analysis and understanding Aerial scene analysis and remote sensing Deep learning models in computer vision Both methodological and applications orientated papers are welcome. Manuscripts submitted are expected to include a detailed and analytical review of the literature and state-of-the-art exposition of the original proposed research and its methodology, its thorough experimental evaluation, and last but not least, comparative evaluation against relevant and state-of-the-art methods. Submissions not abiding by these minimum requirements may be returned to authors without being sent to review. Special Issues Current Call for Papers: Computer Vision for Smart Cameras and Camera Networks - https://digital-library.theiet.org/files/IET_CVI_SC.pdf Computer Vision for the Creative Industries - https://digital-library.theiet.org/files/IET_CVI_CVCI.pdf
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