A comprehensive evaluation of accuracy and performance metrics for a laser on-the-fly processing control system

Ping-Jian Huang, Chien-Fang Ding
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引用次数: 0

Abstract

Laser On-the-Fly processing technology integrates a motion platform and a laser galvanometer scanning system to achieve high-speed and high-precision dynamic on-the-fly processing. In this study, a UV pulsed laser On-the-Fly processing system was developed, and laser processing monitoring technology was introduced to realize real-time optimization of processing parameters through a synchronous multi-axis motion control system. Experimental results demonstrate that the system maintains a circularity error within 1 μm and an average error within 0.1 μm during a 10 μm diameter circular scan. Furthermore, the system achieves scanning speeds exceeding 3000 mm/s while maintaining a pattern distortion ratio of less than 1 %. This system is suitable for both single-axis and dual-axis processing of large-area planar substrates and maintains a stable laser spot with a highly uniform distribution during scanning, thereby effectively improving processing efficiency. The results of this study can provide a potential solution for future microfabrication industries.
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来源期刊
CiteScore
7.40
自引率
5.60%
发文量
177
审稿时长
46 days
期刊介绍: Precision Engineering - Journal of the International Societies for Precision Engineering and Nanotechnology is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. The journal takes an integrated approach to all subjects related to research, design, manufacture, performance validation, and application of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science. The scope includes precision-engineered systems and supporting metrology over the full range of length scales, from atom-based nanotechnology and advanced lithographic technology to large-scale systems, including optical and radio telescopes and macrometrology.
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