Zexi Chen, Weibin Chen, Jie Yao, Jinbo Li, Shiping Wang
{"title":"Deep random walk inspired multi-view graph convolutional networks for semi-supervised classification","authors":"Zexi Chen, Weibin Chen, Jie Yao, Jinbo Li, Shiping Wang","doi":"10.1007/s10489-025-06322-7","DOIUrl":null,"url":null,"abstract":"<div><p>Recent studies highlight the growing appeal of multi-view learning due to its enhanced generalization. Semi-supervised classification, using few labeled samples to classify the unlabeled majority, is gaining popularity for its time and cost efficiency, particularly with high-dimensional and large-scale multi-view data. Existing graph-based methods for multi-view semi-supervised classification still have potential for improvement in further enhancing classification accuracy. Since deep random walk has demonstrated promising performance across diverse fields and shows potential for semi-supervised classification. This paper proposes a deep random walk inspired multi-view graph convolutional network model for semi-supervised classification tasks that builds signal propagation between connected vertices of the graph based on transfer probabilities. The learned representation matrices from different views are fused by an aggregator to learn appropriate weights, which are then normalized for label prediction. The proposed method partially reduces overfitting, and comprehensive experiments show it delivers impressive performance compared to other state-of-the-art algorithms, with classification accuracy improving by more than 5% on certain test datasets.</p></div>","PeriodicalId":8041,"journal":{"name":"Applied Intelligence","volume":"55 6","pages":""},"PeriodicalIF":3.5000,"publicationDate":"2025-02-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Intelligence","FirstCategoryId":"94","ListUrlMain":"https://link.springer.com/article/10.1007/s10489-025-06322-7","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE","Score":null,"Total":0}
引用次数: 0
Abstract
Recent studies highlight the growing appeal of multi-view learning due to its enhanced generalization. Semi-supervised classification, using few labeled samples to classify the unlabeled majority, is gaining popularity for its time and cost efficiency, particularly with high-dimensional and large-scale multi-view data. Existing graph-based methods for multi-view semi-supervised classification still have potential for improvement in further enhancing classification accuracy. Since deep random walk has demonstrated promising performance across diverse fields and shows potential for semi-supervised classification. This paper proposes a deep random walk inspired multi-view graph convolutional network model for semi-supervised classification tasks that builds signal propagation between connected vertices of the graph based on transfer probabilities. The learned representation matrices from different views are fused by an aggregator to learn appropriate weights, which are then normalized for label prediction. The proposed method partially reduces overfitting, and comprehensive experiments show it delivers impressive performance compared to other state-of-the-art algorithms, with classification accuracy improving by more than 5% on certain test datasets.
期刊介绍:
With a focus on research in artificial intelligence and neural networks, this journal addresses issues involving solutions of real-life manufacturing, defense, management, government and industrial problems which are too complex to be solved through conventional approaches and require the simulation of intelligent thought processes, heuristics, applications of knowledge, and distributed and parallel processing. The integration of these multiple approaches in solving complex problems is of particular importance.
The journal presents new and original research and technological developments, addressing real and complex issues applicable to difficult problems. It provides a medium for exchanging scientific research and technological achievements accomplished by the international community.