A Review of Ga₂O₃ Heterojunctions for Deep-UV Photodetection: Current Progress, Methodologies, and Challenges

IF 5.3 2区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY Advanced Electronic Materials Pub Date : 2025-02-10 DOI:10.1002/aelm.202400898
Alfred Moore, Saqib Rafique, Ciaran Llewelyn, Dan Lamb, Lijie Li
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Abstract

In recent years, gallium oxide (Ga2O3) has drawn considerable research interest as an ultrawide-bandgap semiconductor due to its promising applications in the power electronics, photodetection, and gas sensing. Moreover, Ga2O3 heterojunctions have emerged as a promising approach to address key limitations of Ga2O3 as a standalone material—most notably, its lack of p-type doping capability. One of the key application areas for Ga2O3 and its heterojunctions is ultraviolet (UV) photodetection, which has gained significant attention yet remains a relatively nascent field with vast potential for further exploration and optimization. This review provides a detailed overview of the current state-of-the-art in Ga2O3 technology, highlighting recent research advancements, key challenges, and emerging strategies aimed at overcoming these challenges. Specifically, it examines Ga2O3 heterojunctions for deep-UV photodetection, analysing compatible electrode materials and assessing various substrates suitable for Ga2O3 growth to enhance device performance. This comprehensive review is designed to serve as an essential resource for researchers and engineers working with Ga2O3-based heterojunctions, especially for applications in UV photodetection. Written with the needs of new entrants in mind, it aims to build a robust foundational understanding of Ga2O3 technology, supporting ongoing innovation and application expansion in this field.

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用于深紫外光探测的Ga₂O₃异质结综述:目前的进展,方法和挑战
近年来,氧化镓(Ga2O3)作为一种超宽带隙半导体,由于其在电力电子、光探测和气体传感等领域的应用前景广阔,引起了广泛的研究兴趣。此外,Ga2O3异质结已经成为解决Ga2O3作为独立材料的关键限制的一种有前途的方法-最值得注意的是,它缺乏p型掺杂能力。Ga2O3及其异质结的关键应用领域之一是紫外(UV)光探测,这一领域已受到广泛关注,但仍是一个相对新兴的领域,具有进一步探索和优化的巨大潜力。这篇综述提供了当前Ga2O3技术的详细概述,突出了最近的研究进展,关键挑战,以及旨在克服这些挑战的新兴战略。具体来说,它研究了用于深紫外光检测的Ga2O3异质结,分析了兼容的电极材料,并评估了适合Ga2O3生长的各种衬底,以提高器件性能。这篇全面的综述旨在为研究ga2o3异质结的研究人员和工程师提供重要的资源,特别是在紫外光探测方面的应用。在编写时考虑到新进入者的需求,它旨在建立对Ga2O3技术的强大基础理解,支持该领域的持续创新和应用扩展。
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来源期刊
Advanced Electronic Materials
Advanced Electronic Materials NANOSCIENCE & NANOTECHNOLOGYMATERIALS SCIE-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
11.00
自引率
3.20%
发文量
433
期刊介绍: Advanced Electronic Materials is an interdisciplinary forum for peer-reviewed, high-quality, high-impact research in the fields of materials science, physics, and engineering of electronic and magnetic materials. It includes research on physics and physical properties of electronic and magnetic materials, spintronics, electronics, device physics and engineering, micro- and nano-electromechanical systems, and organic electronics, in addition to fundamental research.
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