Phase-Coherent Transport in GeSn Alloys on Si (Adv. Electron. Mater. 2/2025)

IF 5.3 2区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY Advanced Electronic Materials Pub Date : 2025-02-10 DOI:10.1002/aelm.202570004
Prateek Kaul, Omar Concepción, Daan H. Wielens, Patrick Zellekens, Chuan Li, Zoran Ikonic, Koji Ishibashi, Qing-Tai Zhao, Alexander Brinkman, Detlev Grützmacher, Dan Buca
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Abstract

Phase-Coherent Transport

In article number 2300565, Prateek Kaul, Dan Buca, and co-workers perform magneto-transport measurements on Hall bar devices on the novel alloy system GeSn grown on a Si wafer. The measurements reveal robust phase-coherent transport in high Sn concentrations with weak-localization effects and Shubnikov-de Haas oscillations (pictured). These are further used to extract coherence length, mobility and effective mass of Gamma-valley electrons in direct bandgap GeSn, setting forward a baseline for further experiments on the novel material system for its electronics, spintronics, and quantum computing applications.

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来源期刊
Advanced Electronic Materials
Advanced Electronic Materials NANOSCIENCE & NANOTECHNOLOGYMATERIALS SCIE-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
11.00
自引率
3.20%
发文量
433
期刊介绍: Advanced Electronic Materials is an interdisciplinary forum for peer-reviewed, high-quality, high-impact research in the fields of materials science, physics, and engineering of electronic and magnetic materials. It includes research on physics and physical properties of electronic and magnetic materials, spintronics, electronics, device physics and engineering, micro- and nano-electromechanical systems, and organic electronics, in addition to fundamental research.
期刊最新文献
Issue Information Highly Efficient Spin-Orbit Torque Switching in a Topological Insulator/Chromium Telluride Heterostructure with Opposite Berry Curvature A Review of Ga₂O₃ Heterojunctions for Deep-UV Photodetection: Current Progress, Methodologies, and Challenges Phase-Coherent Transport in GeSn Alloys on Si (Adv. Electron. Mater. 2/2025) Magnetic Field Screening of 2D Materials Revealed by Magnetic Force Microscopy (Adv. Electron. Mater. 2/2025)
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