Experimental investigation of saturation recovery behavior in MCP-PMT

IF 1.4 3区 物理与天体物理 Q3 INSTRUMENTS & INSTRUMENTATION Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment Pub Date : 2025-05-01 Epub Date: 2025-02-13 DOI:10.1016/j.nima.2025.170323
Kuinian Li , Yonglin Wei , Hulin Liu , Ping Chen , Luanxuan He , Riguang Chen , Xinnan Zhao , Dingjun Zhou , Jinshou Tian , Shengli Wu
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Abstract

The MCP-PMT is a single-photon sensitive detector with a time resolution of tens of picoseconds. Utilizing ALD technology to fabricate nanofilms on the inner surfaces of microchannel plates significantly prolongs the lifetime of the MCP-PMT, enabling it to achieve an integrated anode charge exceeding 10 C/cm2. However, for the long-lifetime MCP-PMTs using ALD technology, high counting rate saturation can lead to recovery time extending over several hours. This study presents experimental research on the saturation recovery behavior of MCP-PMTs fabricated with varying ALD layer thicknesses. The results suggest that the saturation recovery behavior is influenced by factors such as ALD layer thickness, MCP gain, saturation degree, and saturation duration. Specifically, a thicker ALD layer, deeper saturation, and longer saturation duration are associated with longer recovery time. When the output charge is constant, increasing the MCP gain has been demonstrated to decrease the recovery time from saturation. This paper clarifies the experimental findings by analyzing charge accumulation on the oxide film layer. The composition of the secondary electron emission layer on the microchannel plate's inner wall determines the polarity of the charges accumulating on its surface, which in turn dictates the saturation recovery behavior.
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MCP-PMT饱和采收率实验研究
MCP-PMT是一种单光子敏感探测器,时间分辨率为几十皮秒。利用ALD技术在微通道板的内表面制造纳米膜,显著延长了MCP-PMT的使用寿命,使其能够实现超过10 C/cm2的集成阳极电荷。然而,对于使用ALD技术的长寿命mcp - pmt,高计数率饱和可能导致恢复时间延长数小时。实验研究了不同ALD层厚度的mcp - pmt的饱和恢复行为。结果表明,饱和恢复行为受ALD层厚度、MCP增益、饱和度和饱和持续时间等因素的影响。具体来说,ALD层越厚,饱和度越高,饱和持续时间越长,恢复时间越长。当输出电荷恒定时,增加MCP增益可以减少从饱和状态恢复的时间。本文通过对氧化膜层电荷积累的分析,阐明了实验结果。微通道板内壁的二次电子发射层的组成决定了其表面积聚的电荷的极性,这反过来又决定了饱和恢复行为。
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来源期刊
CiteScore
3.20
自引率
21.40%
发文量
787
审稿时长
1 months
期刊介绍: Section A of Nuclear Instruments and Methods in Physics Research publishes papers on design, manufacturing and performance of scientific instruments with an emphasis on large scale facilities. This includes the development of particle accelerators, ion sources, beam transport systems and target arrangements as well as the use of secondary phenomena such as synchrotron radiation and free electron lasers. It also includes all types of instrumentation for the detection and spectrometry of radiations from high energy processes and nuclear decays, as well as instrumentation for experiments at nuclear reactors. Specialized electronics for nuclear and other types of spectrometry as well as computerization of measurements and control systems in this area also find their place in the A section. Theoretical as well as experimental papers are accepted.
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