Learning with limited annotations: Deep semi-supervised learning paradigm for layer-wise defect detection in laser powder bed fusion

IF 5 2区 物理与天体物理 Q1 OPTICS Optics and Laser Technology Pub Date : 2025-07-01 Epub Date: 2025-02-17 DOI:10.1016/j.optlastec.2025.112586
Kunpeng Tan, Jiafeng Tang, Zhibin Zhao, Chenxi Wang, Xingwu Zhang, Huihui Miao, Xuefeng Chen
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Abstract

Powder bed quality is critical to the quality of parts manufactured by laser powder bed fusion (LPBF) and mass production. Recently, numerous powder bed defect detection methods based on semantic segmentation algorithms have been developed. However, these data-driven approaches face the indispensable challenge of insufficient annotated data. Especially in the context of defect segmentation in Additive Manufacturing (AM), pixel-wise image labeling is time-consuming and demands substantial prior knowledge. Semi-supervised Learning (SSL) can leverage unlabeled data to enhance the training process of deep learning models. During the layer-by-layer forming process in LPBF, thousands of powder bed images can be obtained but most of them remain unused because of the lack of annotations, which fully satisfy the situation with semi-supervised learning. To address the above issue, this paper proposes a deep semi-supervised learning-based paradigm for powder bed defect segmentation, allowing model learning with limited annotated data. Concretely, the proposed paradigm generates pseudo-labels for unlabeled data, enabling the utilization of a substantial amount of unlabeled data in the manufacturing process. Aiming at the issue of low-quality pseudo-labels generated from low-quality unlabeled data, we employ Mean Teacher Framework to separate the generation of pseudo-labels. Moreover, aiming at the lack of data diversity, we employ Consistency Regularization to enhance the model’s generalization performance. Additionally, we created a dataset comprising 406 images of powder-bed defects, with each image annotated at the pixel level. Extensive experiments on the dataset have shown the proposed paradigm’s effectiveness over supervised methods, even with limited labeled data (only 1/8 annotated).
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有限标注学习:激光粉末床熔合中分层缺陷检测的深度半监督学习范式
粉末床质量对激光粉末床熔合加工和批量生产的零件质量至关重要。近年来,基于语义分割算法的粉末床缺陷检测方法层出不穷。然而,这些数据驱动的方法面临着标注数据不足的不可缺少的挑战。特别是在增材制造(AM)缺陷分割的背景下,逐像素图像标记是耗时的,并且需要大量的先验知识。半监督学习(SSL)可以利用未标记的数据来增强深度学习模型的训练过程。在LPBF逐层成形过程中,可以获得成千上万的粉床图像,但由于缺乏注释,大部分图像未被使用,完全满足了半监督学习的情况。为了解决上述问题,本文提出了一种基于深度半监督学习的粉末床缺陷分割范式,允许模型在有限的注释数据下学习。具体地说,所提出的范例为未标记的数据生成伪标签,从而能够在制造过程中利用大量未标记的数据。针对低质量未标注数据生成低质量伪标签的问题,采用均值教师框架对伪标签的生成进行分离。此外,针对数据多样性不足的问题,采用一致性正则化方法提高模型的泛化性能。此外,我们创建了一个包含406张粉末床缺陷图像的数据集,每张图像都在像素级进行了注释。在数据集上进行的大量实验表明,即使在有限的标记数据(只有1/8注释)下,所提出的范式也优于监督方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
8.50
自引率
10.00%
发文量
1060
审稿时长
3.4 months
期刊介绍: Optics & Laser Technology aims to provide a vehicle for the publication of a broad range of high quality research and review papers in those fields of scientific and engineering research appertaining to the development and application of the technology of optics and lasers. Papers describing original work in these areas are submitted to rigorous refereeing prior to acceptance for publication. The scope of Optics & Laser Technology encompasses, but is not restricted to, the following areas: •development in all types of lasers •developments in optoelectronic devices and photonics •developments in new photonics and optical concepts •developments in conventional optics, optical instruments and components •techniques of optical metrology, including interferometry and optical fibre sensors •LIDAR and other non-contact optical measurement techniques, including optical methods in heat and fluid flow •applications of lasers to materials processing, optical NDT display (including holography) and optical communication •research and development in the field of laser safety including studies of hazards resulting from the applications of lasers (laser safety, hazards of laser fume) •developments in optical computing and optical information processing •developments in new optical materials •developments in new optical characterization methods and techniques •developments in quantum optics •developments in light assisted micro and nanofabrication methods and techniques •developments in nanophotonics and biophotonics •developments in imaging processing and systems
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