Large-Area Surface Measurement of Spherical Parts Based on Interferometry

IF 5.9 2区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Instrumentation and Measurement Pub Date : 2025-01-24 DOI:10.1109/TIM.2025.3533645
Sicheng Jiao;Junhua Wang;Minge Gao;Daixin Huang;Fang Ji;Min Xu
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Abstract

High-precision spherical parts are widely used in measurement machines, MEMS devices, and other fields, but there are few effective methods for the full annular area measurement of sphere surface. In this article, an interferometry-based method for the full annular surface measurement of spherical parts is proposed. By adding an off-axis parabolic mirror, the parallel beam was converted into an annular beam, enabling the measurement of sphere surface near the equator. The method was validated using a Zygo interferometer and approximately one-sixth of the surface was measured in one single measurement. The eccentricity error was minimized by error compensation algorithm, and the surface error of paraboloid was calibrated using a reference ball. A large range of surface near the equator can be efficiently obtained in one single measurement and verification measurement results indicate its efficiency and reliability.
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基于干涉测量的球面零件大面积表面测量
高精度球面零件广泛应用于测量机、MEMS器件等领域,但球面全环形面积测量的有效方法很少。本文提出了一种基于干涉法的球面零件全环面测量方法。通过增加离轴抛物面镜,将平行光束转换成环形光束,从而可以测量赤道附近的球面。使用Zygo干涉仪对该方法进行了验证,一次测量可测量约六分之一的表面。采用误差补偿算法最小化偏心误差,并利用参考球标定抛物面曲面误差。单次测量可以有效地获得大范围的赤道附近地表,验证测量结果表明了该方法的有效性和可靠性。
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来源期刊
IEEE Transactions on Instrumentation and Measurement
IEEE Transactions on Instrumentation and Measurement 工程技术-工程:电子与电气
CiteScore
9.00
自引率
23.20%
发文量
1294
审稿时长
3.9 months
期刊介绍: Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.
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