Single-Event Functional Interrupt Mapping of cm-Size Microprocessor Using Ion Microbeam

Abstract

Single-event functional interrupts (SEFIs) in microprocessors (MPUs) due to high-energy space radiation have important implications for the reliability and safety of spaceborne systems. To study the system-level SEFI of the commercially available MPC750 MPU, which has promising aerospace applications, a large-size hybrid mapping method was established based on a high-energy heavy-ion microbeam platform. SEFI-sensitive areas across the centimeter-size die were then mapped using the krypton ion microbeam in conjunction with the decrypted device layout. Additionally, detailed SEFI cross sections, generation conditions, and propagation mechanisms were analyzed, highlighting the significance of the exception model in SEFI generation and mitigation. This investigation provides valuable insights into radiation reliability and radiation-hardening design for the MPC750 and Harvard Architecture MPUs in space applications.