{"title":"SSGDD-YOLO: Multiscale Feature Fusion and Multiattention-Based YOLO for Smartphone Screen Glass Defect Detection","authors":"Ping Wu;Haote Zhou;Yicheng Yu;Zengdi Miao;Qianqian Pan;Xi Zhang;Jinfeng Gao","doi":"10.1109/JSEN.2024.3524584","DOIUrl":null,"url":null,"abstract":"Surface defect detection is essential for ensuring the product quality of smartphone screen glass. In this work, a smartphone screen glass defect detection model based on an enhanced YOLOv7 framework with multiscale feature fusion and multiattention, named SSGDD-you only look once (YOLO) is proposed. In the developed SSGDD-YOLO model, the branch fusion block (BFB) is integrated low-level features from multiple scales through parallel processing, to enhance the details in lower level features for minimizing the information loss as less as possible. Furthermore, the SPPCSPC module of the head is improved as the SPPCSPC-I module, by replacing the standard max pooling with local importance-based pooling (LIP) that reflects the importance of features. The developed SPPCSPC-I module allows the network to automatically learn adaptive importance weights of features during downsampling, enhancing the multiscale feature extraction capability with diverse receptive fields. Finally, a contour-mixed attention block (C-MAB) is inserted into the feature fusion section of the network, which enhances spatial and channel information of features to reduce target information loss, improving the representation capability. Experiments are conducted using a challenging real-world defect image dataset gathered from a smartphone screen glass inspection line in an industrial plant. Results show the proposed SSGDD-YOLO model can achieve the highest mAP of 62.46% among all compared methods.","PeriodicalId":447,"journal":{"name":"IEEE Sensors Journal","volume":"25 4","pages":"6982-6994"},"PeriodicalIF":4.3000,"publicationDate":"2025-01-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Sensors Journal","FirstCategoryId":"103","ListUrlMain":"https://ieeexplore.ieee.org/document/10834520/","RegionNum":2,"RegionCategory":"综合性期刊","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Surface defect detection is essential for ensuring the product quality of smartphone screen glass. In this work, a smartphone screen glass defect detection model based on an enhanced YOLOv7 framework with multiscale feature fusion and multiattention, named SSGDD-you only look once (YOLO) is proposed. In the developed SSGDD-YOLO model, the branch fusion block (BFB) is integrated low-level features from multiple scales through parallel processing, to enhance the details in lower level features for minimizing the information loss as less as possible. Furthermore, the SPPCSPC module of the head is improved as the SPPCSPC-I module, by replacing the standard max pooling with local importance-based pooling (LIP) that reflects the importance of features. The developed SPPCSPC-I module allows the network to automatically learn adaptive importance weights of features during downsampling, enhancing the multiscale feature extraction capability with diverse receptive fields. Finally, a contour-mixed attention block (C-MAB) is inserted into the feature fusion section of the network, which enhances spatial and channel information of features to reduce target information loss, improving the representation capability. Experiments are conducted using a challenging real-world defect image dataset gathered from a smartphone screen glass inspection line in an industrial plant. Results show the proposed SSGDD-YOLO model can achieve the highest mAP of 62.46% among all compared methods.
表面缺陷检测是保证智能手机屏幕玻璃产品质量的关键。本文提出了一种基于多尺度特征融合和多注意力增强YOLOv7框架的智能手机屏幕玻璃缺陷检测模型——SSGDD-you only look once (YOLO)。在所开发的SSGDD-YOLO模型中,分支融合块(BFB)通过并行处理将多个尺度的底层特征融合在一起,增强底层特征中的细节,尽可能减少信息丢失。此外,将头部的SPPCSPC模块改进为SPPCSPC- i模块,用反映特征重要性的基于局部重要性的池化(LIP)取代标准的最大池化。开发的SPPCSPC-I模块允许网络在降采样过程中自动学习自适应特征的重要权重,增强了具有不同接受域的多尺度特征提取能力。最后,在网络的特征融合部分插入轮廓混合注意块(C-MAB),增强特征的空间信息和通道信息,减少目标信息的丢失,提高表征能力。实验使用从工业工厂的智能手机屏幕玻璃检测线收集的具有挑战性的真实世界缺陷图像数据集进行。结果表明,所提出的SSGDD-YOLO模型的mAP值最高,达到62.46%。
期刊介绍:
The fields of interest of the IEEE Sensors Journal are the theory, design , fabrication, manufacturing and applications of devices for sensing and transducing physical, chemical and biological phenomena, with emphasis on the electronics and physics aspect of sensors and integrated sensors-actuators. IEEE Sensors Journal deals with the following:
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-Optical Sensors
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-Sensors in Industrial Practice