Impact of atmospheric pressure cold plasma on the physicochemical, rheological, chemical functional groups via FTIR spectroscopy and antioxidant characteristics of sunn pest (Eurygaster integriceps)-damaged wheat flour

Abstract

Achieving the desired quality product characteristics with Sunn pest (Eurygaster integriceps) damaged wheat flour (SDWF) is still a major challenge. Cold plasma technology (CPT) is a promising innovative alternative to improve the technological qualities of SDWF. This study is aimed to determine the effect of CPT on physicochemical, rheological, chemical functional groups (OH, N-H, C = O, C-O-C, C-O and C-O-H) by using Fourier Transform Infrared Spectroscopy (FTIR) and antioxidant properties of SDWF. SDWF was subjected to CPT for various exposure times (0, 30, 45, and 60 s). CPT-treated SDWF showed a significant increase in gluten index values regardless of the exposure time. Moreover, the CPT significantly enhanced the delayed sedimentation, with a 45s exposure time demonstrating the greatest improvement. Falling numbers of SDWF approached standard values with 45 and 60 s CPT. The Kieffer dough extensibilities were significantly impacted by both CPT and its varying exposure times. CPT reduced the SMS/Chen-Hoseney dough stickiness, a significant issue in SDWF. FTIR analysis revealed an increase in OH concentration at all CPT times, and an increase in α-helix structure and β-layer at 30 and 45 s treatment times. When CPT was administered for longer than 30 s, both bond and free phenolic content of SDWF decreased. Based on our results, we can strongly suggest that CPT could be used to improve the technological properties of SDWF, even for short exposure times such as 30 and 45 s; thus, this innovative technology has the potential to improve the bread-making quality of these flours.