A Bottom-Up Machine-Learning Approach for Efficient Device Simulation

IF 2.9 2区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Electron Devices Pub Date : 2025-01-31 DOI:10.1109/TED.2025.3533465
Xiaoxin Xie;Yuchen Wang;Zili Tang;Yijiao Wang;Xing Zhang;Fei Liu
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Abstract

The combination of machine-learning (ML) and electronic structure computation has proven effective in studying various properties of molecules and crystals at the atomistic level. However, challenges arise when these molecules or crystals are contacted with external electrodes, complicating the description of quantum transport properties using existing methods. In this study, we propose an attention-based heterogeneous graph neural network to characterize the global field and dynamic features of open systems. Our approach aims to accelerate or bypass the resource-intensive self-consistent iterations of solving Schrödinger and Poisson equations within nonequilibrium Green’s function (NEGF) formalism from the bottom-up, significantly improving the efficiency of quantum transport calculations. Representing the device with a heterogeneous graph largely retains its intrinsic physical characteristics, while the global graph attention network (GAT) effectively captures the propagation of nonlocal physical information, addressing prediction accuracy challenges due to device scaling. The global field heterogeneous graph neural network (GFGNN) demonstrates high accuracy, significant acceleration, and potential transferability at different channel lengths in simulations of p-n junctions (two-terminal with significant tunneling effect) and MOSFETs (three-terminal).
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用于高效设备仿真的自下而上机器学习方法
事实证明,机器学习(ML)与电子结构计算的结合可以有效地在原子水平上研究分子和晶体的各种特性。然而,当这些分子或晶体与外部电极接触时就会出现挑战,从而使现有方法对量子传输特性的描述变得复杂。在本研究中,我们提出了一种基于注意力的异构图神经网络,用于描述开放系统的全局场和动态特征。我们的方法旨在加速或绕过非平衡格林函数(NEGF)形式中自下而上求解薛定谔方程和泊松方程的资源密集型自洽迭代,从而显著提高量子输运计算的效率。用异构图表示器件在很大程度上保留了其内在物理特性,而全局图注意网络(GAT)则有效捕捉了非局部物理信息的传播,解决了器件缩放带来的预测精度挑战。在模拟 p-n 结(具有显著隧道效应的两端)和 MOSFET(三端)时,全局场异质图神经网络(GFGNN)在不同沟道长度上表现出了高精度、显著的加速性和潜在的可转移性。
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来源期刊
IEEE Transactions on Electron Devices
IEEE Transactions on Electron Devices 工程技术-工程:电子与电气
CiteScore
5.80
自引率
16.10%
发文量
937
审稿时长
3.8 months
期刊介绍: IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.
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