{"title":"Gd–Reference–Layer Method for the Case of Two Reflectometry Experiments","authors":"E. S. Nikova, Yu. A. Salamatov, E. A. Kravtsov","doi":"10.1134/S1027451024701593","DOIUrl":null,"url":null,"abstract":"<p>The article presents an approach to determining the modulus and phase of neutron reflection amplitude using a gadolinium reference layer, which allows reducing the number of necessary experiments from three to two. It is shown that it is possible to reconstruct the reflection amplitude based on the results of only two reflectometric experiments. However, when conducting two experiments, calculating the reflection amplitude is complicated by the fact that there will be two solutions instead of one. Therefore, it is necessary to evaluate the obtained results, since one of these solutions will have no physical meaning. The results are evaluated based on a priori information about the sample or with the help of additional modeling of the interaction potential. The theory of the proposed approach is described in detail, and it is tested on model numerical calculations for the Al<sub>2</sub>O<sub>3</sub>//Ti film. Experimental results for the test samples Al<sub>2</sub>O<sub>3</sub>//Nb and Si//Cr/Fe/Cr are presented. A comparison of the moduli and phases of the reflectivity obtained by processing three and two experiments is carried out. It was found that under conditions of poor statistics, conducting two experiments is preferable, since the solution, in this case, contains fewer artifacts of mathematical processing.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 6","pages":"1595 - 1601"},"PeriodicalIF":0.5000,"publicationDate":"2025-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451024701593","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
The article presents an approach to determining the modulus and phase of neutron reflection amplitude using a gadolinium reference layer, which allows reducing the number of necessary experiments from three to two. It is shown that it is possible to reconstruct the reflection amplitude based on the results of only two reflectometric experiments. However, when conducting two experiments, calculating the reflection amplitude is complicated by the fact that there will be two solutions instead of one. Therefore, it is necessary to evaluate the obtained results, since one of these solutions will have no physical meaning. The results are evaluated based on a priori information about the sample or with the help of additional modeling of the interaction potential. The theory of the proposed approach is described in detail, and it is tested on model numerical calculations for the Al2O3//Ti film. Experimental results for the test samples Al2O3//Nb and Si//Cr/Fe/Cr are presented. A comparison of the moduli and phases of the reflectivity obtained by processing three and two experiments is carried out. It was found that under conditions of poor statistics, conducting two experiments is preferable, since the solution, in this case, contains fewer artifacts of mathematical processing.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.