E. N. Stepanova, G. P. Grabovetskaya, A. D. Teresov, M. A. Kruglyakov
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引用次数: 0
Abstract
The diffusion of chromium from the surface was studied in a polycrystalline Zr–1 wt % Nb alloy under conditions of isothermal diffusion annealing and irradiation with a pulsed electron beam in the temperature range of (0.3–0.4) of the zirconium melting temperature using the high-frequency glow discharge optical emission spectrometry methods. It has been established that the deposition of a chromium film on the surface of the Zr–1 wt % Nb alloy by reactive magnetron sputtering of a target leads to the formation of a zone of mutual penetration of chromium and zirconium. In this case, the grain sizes, as well as the sizes and distribution of particles of the β-Nb phase in the Zr–1 wt % Nb alloy, do not change. Isothermal diffusion annealing and irradiation with a pulsed electron beam result in an increase in the width of the zone of mutual penetration of chromium and zirconium compared to the state after deposition of a chromium film on the alloy surface. A comparative assessment of the chromium diffusion parameter sDb (s is the segregation coefficient, and Db is the grain boundary diffusion coefficient) under conditions of isothermal diffusion annealing and irradiation with a pulsed electron beam using the Whipple-Le-Clair equation with a grain boundary width of 0.5 nm was carried out. It has been shown that under conditions of simultaneous exposure to temperature and irradiation with a pulsed electron beam the sDb parameter increases and the activation energy of grain-boundary diffusion of chromium in the Zr–1 wt % Nb alloy decreases in the near-surface layer of the alloy.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.