Analysis of Thermal-Induced Microstructural Changes in Nanoscale Zr/Nb Metal Layers after Proton Irradiation

A. D. Lomygin, D. G. Krotkevich, R. S. Laptev, E. N. Stepanova, A. A. Sidorin, O. S. Orlov
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Abstract

The effect of annealing on the microstructure, defect structure, and mechanical properties of nanoscale metal systems consisting of alternating layers of Zr and Nb is considered. The effect of annealing was studied on coatings pre-irradiated with protons. Nanoscale Zr/Nb metal layers were prepared using the magnetron sputtering method, each layer was 50 nm thick, and the total thickness of coatings was about 1 μm. Using electron microscopy and glow discharge optical emission spectrometry, it was shown that the multilayer structure was preserved after both irradiation and annealing of irradiated Zr/Nb samples. After annealing at 300°C, a decrease in hydrogen luminescence intensity and proton redistribution were observed. Using X-ray phase analysis, it was shown that at an annealing temperature of 200°C, the interplanar distances for Zr and Nb decreased. At an annealing temperature of 300°C, a sharp increase in the interplanar distance in Zr layers and a slight decrease in the interplanar distance in Nb layers were detected. Layer-by-layer analysis of defects in nanoscale metal layers using variable-energy positron beam and Doppler broadening spectroscopy showed that increasing the annealing temperature stimulated the migration and annihilation of defects at interfaces. Regions of reduced electron density at the interfaces on the zirconium side remain the predominant positron capture centers.

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质子辐照后纳米Zr/Nb金属层热致显微结构变化分析
研究了退火对由Zr和Nb相间层组成的纳米级金属体系的微观结构、缺陷结构和力学性能的影响。研究了退火对质子预辐照涂层的影响。采用磁控溅射法制备了纳米Zr/Nb金属层,每层厚度为50 nm,镀层总厚度约为1 μm。利用电子显微镜和辉光发射光谱分析表明,辐照后的Zr/Nb样品在辐照和退火后都保留了多层结构。在300℃退火后,观察到氢发光强度降低,质子重分布。x射线相分析表明,在200℃的退火温度下,Zr和Nb的面间距离减小。在300℃的退火温度下,Zr层的面间距急剧增大,Nb层的面间距略有减小。利用变能正电子束和多普勒展宽光谱对纳米金属层中的缺陷进行了逐层分析,结果表明,退火温度的升高促进了缺陷在界面处的迁移和湮灭。锆侧界面上电子密度降低的区域仍然是主要的正电子捕获中心。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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