Atomistic Simulation of Segregation in Ternary Pt–Pd–Ni Nanoalloy

N. I. Nepsha, N. Yu. Sdobnyakov, V. M. Samsonov, I. V. Talyzin, A. Yu. Kolosov, D. V. Zhigunov, K. G. Savina, A. A. Romanov
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Abstract

The results of comparative atomistic simulation are presented for segregation and thermally induced structural transformations (melting/crystallization) in binary Pt–Pd nanoalloys and ternary Pt–Pd–Ni nanoparticles, where Ni (20 at %) acted as a doping component. Atomistic simulation was carried out using an integrated approach combining molecular dynamics and Monte Carlo methods. In addition, two independently developed computer programs, LAMMPS and Metropolis, two different parameterizations of potentials corresponding to the embedded atom method, as well as an alternative force field, the tight-binding potential, were used for the simulation. Surface segregation of Pd was observed in both binary and ternary nanoparticles consisting of 2500 and 5000 atoms. Most noticeably, doping affected structural segregation, inducing a transition from a nanocrystal consisting of several fcc grains to a nanocluster with approximately pentagonal symmetry. It has been established that the size effect is more noticeable for parameters of the melting–crystallization hysteresis than for the structural segregation patterns, that is, the division of a nanoparticle into areas corresponding to different crystal structures and the segregation of components.

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CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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