Solid-state thinning of violet phosphorus by femtosecond laser and facile recognition of its thickness

IF 5 2区 物理与天体物理 Q1 OPTICS Optics and Laser Technology Pub Date : 2025-03-03 DOI:10.1016/j.optlastec.2025.112698
Xiaohui Ye , Miaomiao Wei , Zhiyuan Yang , Yurong Li , Xi Zheng , Mengzhen Chen , Shubin Huang , Yi He , Jiachuan Liang , Mengyue Gu , Liang Guo , Jinying Zhang
{"title":"Solid-state thinning of violet phosphorus by femtosecond laser and facile recognition of its thickness","authors":"Xiaohui Ye ,&nbsp;Miaomiao Wei ,&nbsp;Zhiyuan Yang ,&nbsp;Yurong Li ,&nbsp;Xi Zheng ,&nbsp;Mengzhen Chen ,&nbsp;Shubin Huang ,&nbsp;Yi He ,&nbsp;Jiachuan Liang ,&nbsp;Mengyue Gu ,&nbsp;Liang Guo ,&nbsp;Jinying Zhang","doi":"10.1016/j.optlastec.2025.112698","DOIUrl":null,"url":null,"abstract":"<div><div>Violet Phosphorus (VP), as a burgeoning layered material, has numerous remarkable merits, which strongly depend on its thicknesses. It is significant to control and recognize the thickness in a facile way for widely applications. This paper employed 515 nm femtosecond (fs) laser to control VP thickness in solid state precisely. The VP nanosheets were exfoliated from 500 nm to 80 nm at a span of dozens of nanometers. The mechanism of VP exfoliation was the interaction of laser and VP. The laser decreased the interlayer Van der Waals force and increases the lattice vibration, leading to the decomposition of VP. Various approaches were conducted to characterize the thickness of VP quantitatively and qualitatively. The strict correspondence was established between RGB in optical images and layer number of VP. It can easily obtain the thickness information only by optical images rather than expensive and time-consuming atomic force microscopy (AFM). This work develops a novel approach to exfoliate VP in solid state for high-end applications, and provides a facile thought to quantitative characterize the VP thicknesses in an efficient and low-cost mean.</div></div>","PeriodicalId":19511,"journal":{"name":"Optics and Laser Technology","volume":"186 ","pages":"Article 112698"},"PeriodicalIF":5.0000,"publicationDate":"2025-03-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics and Laser Technology","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0030399225002865","RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"OPTICS","Score":null,"Total":0}
引用次数: 0

Abstract

Violet Phosphorus (VP), as a burgeoning layered material, has numerous remarkable merits, which strongly depend on its thicknesses. It is significant to control and recognize the thickness in a facile way for widely applications. This paper employed 515 nm femtosecond (fs) laser to control VP thickness in solid state precisely. The VP nanosheets were exfoliated from 500 nm to 80 nm at a span of dozens of nanometers. The mechanism of VP exfoliation was the interaction of laser and VP. The laser decreased the interlayer Van der Waals force and increases the lattice vibration, leading to the decomposition of VP. Various approaches were conducted to characterize the thickness of VP quantitatively and qualitatively. The strict correspondence was established between RGB in optical images and layer number of VP. It can easily obtain the thickness information only by optical images rather than expensive and time-consuming atomic force microscopy (AFM). This work develops a novel approach to exfoliate VP in solid state for high-end applications, and provides a facile thought to quantitative characterize the VP thicknesses in an efficient and low-cost mean.

Abstract Image

查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
飞秒激光对紫色磷的固态减薄及其厚度的快速识别
紫磷(VP)作为一种新兴的层状材料,具有许多显著的优点,这在很大程度上取决于它的厚度。如何方便地控制和识别厚度,对于广泛应用具有重要意义。本文采用515 nm飞秒(fs)激光精确控制固态VP厚度。VP纳米片在500 nm到80 nm之间以几十纳米的跨度进行剥离。VP剥落的机理是激光与VP的相互作用。激光降低了层间范德华力,增加了晶格振动,导致了VP的分解。采用各种方法定量和定性地表征VP的厚度。建立了光学图像RGB与VP层数的严格对应关系。它可以方便地通过光学图像获得厚度信息,而不是昂贵且耗时的原子力显微镜(AFM)。这项工作开发了一种用于高端应用的固态VP剥离的新方法,并提供了一种简单的方法,以高效和低成本的方式定量表征VP厚度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
CiteScore
8.50
自引率
10.00%
发文量
1060
审稿时长
3.4 months
期刊介绍: Optics & Laser Technology aims to provide a vehicle for the publication of a broad range of high quality research and review papers in those fields of scientific and engineering research appertaining to the development and application of the technology of optics and lasers. Papers describing original work in these areas are submitted to rigorous refereeing prior to acceptance for publication. The scope of Optics & Laser Technology encompasses, but is not restricted to, the following areas: •development in all types of lasers •developments in optoelectronic devices and photonics •developments in new photonics and optical concepts •developments in conventional optics, optical instruments and components •techniques of optical metrology, including interferometry and optical fibre sensors •LIDAR and other non-contact optical measurement techniques, including optical methods in heat and fluid flow •applications of lasers to materials processing, optical NDT display (including holography) and optical communication •research and development in the field of laser safety including studies of hazards resulting from the applications of lasers (laser safety, hazards of laser fume) •developments in optical computing and optical information processing •developments in new optical materials •developments in new optical characterization methods and techniques •developments in quantum optics •developments in light assisted micro and nanofabrication methods and techniques •developments in nanophotonics and biophotonics •developments in imaging processing and systems
期刊最新文献
Generation of short microwave pulse trains based on coupled signal mode-locked optoelectronic oscillator Modeling and application of compensator depolarization effects in Mueller matrix ellipsometer Laser generated micro/nanotexturing and controllable wettability of the titanium surface for its implications in different fields A review of the application of machine learning in short-pulse and ultrashort-pulse laser etching Micro-vibration measurement using self-mixing interferometry with an intracavity frequency-doubling solid-state laser
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1