Comparative Study of Microwave Relative Phase Measurement Methods

IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION MAPAN Pub Date : 2025-01-16 DOI:10.1007/s12647-024-00790-x
Dina A. Abd El-Aziz, Ahmed M. Attiya, Hadia M. Elhennawy, Rasha S. M. Ali
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Abstract

Recent advancements in novel radio frequency (RF) microwave phase measurement techniques have generated significant interest. Accurate phase measurement is essential for optimal performance in various applications, including telecommunications, radars, phased array antennas, phase modulators, and GPS receivers. High-precision phase measurement methods are crucial for monitoring subtle phase shift variations accurately. This paper analyzes recent research on microwave relative phase measurement techniques based on homodyne and heterodyne detection principles and the associated challenges related to uncertainty, as utilized by national metrology institutes (NMIs). Under the homodyne principle, the National Institute of Standards and Technology (NIST) measured a single phase based on a bridge circuit at 100° with a phase accuracy of 0.5° at a frequency of 4 GHz. This principle is extended by the National Laboratory for Infrared Physics in Japan to measure phase in the range of 0° to 180° in the X-band with a phase accuracy of 2°. Under the heterodyne principle, NIST also implemented phase measurements using a dual-channel phase-shift measurement system from 0° to 360° with an expanded uncertainty of 0.041º at 17 GHz. Several developments in this principle were introduced to address errors and complexity. In addition, a new innovative phase detection methodology based on power measurements was developed by the National Institute of Standards (NIS) in Egypt. This technique offers precise measurements of relative phase shifts in the range from 0° to 180° with a maximum phase variation of ± 3.5°, covering S and C bands. This review aims to contribute to advancing microwave relative phase measurement techniques and provide insights into alternative methods for improvement.

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来源期刊
MAPAN
MAPAN 工程技术-物理:应用
CiteScore
2.30
自引率
20.00%
发文量
91
审稿时长
3 months
期刊介绍: MAPAN-Journal Metrology Society of India is a quarterly publication. It is exclusively devoted to Metrology (Scientific, Industrial or Legal). It has been fulfilling an important need of Metrologists and particularly of quality practitioners by publishing exclusive articles on scientific, industrial and legal metrology. The journal publishes research communication or technical articles of current interest in measurement science; original work, tutorial or survey papers in any metrology related area; reviews and analytical studies in metrology; case studies on reliability, uncertainty in measurements; and reports and results of intercomparison and proficiency testing.
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