Using non-parametric statistical testing to quantify solute clustering in atom probe reconstructions

IF 2.1 3区 工程技术 Q2 MICROSCOPY Ultramicroscopy Pub Date : 2025-02-24 DOI:10.1016/j.ultramic.2025.114120
William J. Davids, Mengwei He, Huma Bilal, Andrew J. Breen, Simon P. Ringer
{"title":"Using non-parametric statistical testing to quantify solute clustering in atom probe reconstructions","authors":"William J. Davids,&nbsp;Mengwei He,&nbsp;Huma Bilal,&nbsp;Andrew J. Breen,&nbsp;Simon P. Ringer","doi":"10.1016/j.ultramic.2025.114120","DOIUrl":null,"url":null,"abstract":"<div><div>Atom probe tomography (APT) is routinely used to investigate nano-scale solute architecture within multicomponent systems. However, there is no consensus on how to best quantify solute clustering within APT data. This contribution leverages recent developments in the field of non-parametric hypothesis testing of nearest-neighbour distributions to address this critical gap. We adapt a goodness-of-fit-type test statistic known as ‘the level of heterogeneity’ to quantitatively discern whether solute distributions exhibit clustering behaviour beyond what would be expected from a random distribution. Further, comparing APT datasets remains difficult due to the inability to directly compare their nearest-neighbour distributions. We present a method that leverages Monte-Carlo simulations, already used to calculate the non-parametric statistic, as a means of comparing APT data. The method is more powerful than comparing datasets through the Pearson coefficient, as is conventionally done.</div></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"271 ","pages":"Article 114120"},"PeriodicalIF":2.1000,"publicationDate":"2025-02-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Ultramicroscopy","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0304399125000191","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MICROSCOPY","Score":null,"Total":0}
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Abstract

Atom probe tomography (APT) is routinely used to investigate nano-scale solute architecture within multicomponent systems. However, there is no consensus on how to best quantify solute clustering within APT data. This contribution leverages recent developments in the field of non-parametric hypothesis testing of nearest-neighbour distributions to address this critical gap. We adapt a goodness-of-fit-type test statistic known as ‘the level of heterogeneity’ to quantitatively discern whether solute distributions exhibit clustering behaviour beyond what would be expected from a random distribution. Further, comparing APT datasets remains difficult due to the inability to directly compare their nearest-neighbour distributions. We present a method that leverages Monte-Carlo simulations, already used to calculate the non-parametric statistic, as a means of comparing APT data. The method is more powerful than comparing datasets through the Pearson coefficient, as is conventionally done.
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来源期刊
Ultramicroscopy
Ultramicroscopy 工程技术-显微镜技术
CiteScore
4.60
自引率
13.60%
发文量
117
审稿时长
5.3 months
期刊介绍: Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.
期刊最新文献
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