L-shell x-ray fluorescence relative intensities for elements with 64≤Z≤83 at 21 keV and 25 keV by synchrotron radiation

Abstract

The relative intensities and cross sections of L-shell X-ray fluorescence (XRF) for elements with atomic numbers $\text{64}\le Z\le \text{83}$ and compounds containing some of these targeted elements were measured at two excitation energies, 21 keV and 25 keV, using a synchrotron radiation source at XSAFS/XRF beamline of the Synchrotron Light Center for Experimental Science and Applications in the Middle East (SESAME), Jordan. The experimentally measured results of the relative intensities were compared to values obtained by the Fundamental Parameters’ method using two sets from literature, the calculated results based on the Dirac–Hartree–Slater model (DHS) by Puri (1993), and experimental data that are averaged and fitted by Campbell (2003). In this research, L-Shell XRF relative intensities and cross sections for the elements Gd, Er, Ta, W, Re, Tl and Bi and compounds ${\mathrm{GdN}}_3{O}_4$ and ${\mathrm{Hg}}_2{\mathrm{Cl}}_2$ at excitation energies of 21 keV and 25 keV were measured.