Analysis of Collapse-Snapback Phenomena in Capacitive Micromachined Ultrasound Transducers.

Abstract

The pull-in and pull-out voltages are important characteristics of Capacitive Micromachined Ultrasound Transducers (CMUTs), marking the transition between conventional and collapse operation regimes. These voltages are commonly determined using capacitance-voltage (C-V) sweeps. By modeling the operating conditions of an LCR meter in COMSOL Multiphysics^®, we demonstrate that the measured capacitance comprises both static and dynamic capacitances, with the dynamic capacitance causing the appearance of a peak in the effective C-V curve. Furthermore, Laser Doppler Vibrometer (LDV) measurements and electromechanical simulations indicate the occurrence of collapse-snapback phenomena during the C-V sweeps. This study, through advanced simulations and experimental analyses, demonstrates that the transient membrane behavior significantly affects the apparent capacitance-voltage characteristics of electrostatically actuated Micro-Electromechanical Systems (MEMS).