True random calibration method and application of tapped delay line-TDC with spontaneous parametric down-conversion system

IF 5.2 2区 工程技术 Q1 ENGINEERING, MULTIDISCIPLINARY Measurement Pub Date : 2025-03-09 DOI:10.1016/j.measurement.2025.117240
Zhihan Jin , Bing Yu , Junwei Chu , Qing Kang , Jianjun Li
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Abstract

The paper proposes a true random calibration method for field programmable gate array (FPGA) based tapped delay line (TDL)-time-to-digital converters (TDCs), which is suitable for spontaneous parametric down-conversion (SPDC) systems. The Poisson distribution of single-photon detector (SPD) signals based on a Geiger-mode avalanche photodiode (GM-APD) in the SPDC system makes the SPD function as both a detection device and a quantum random pulse generator (QRPG), which can be used for the true random code density calibration of TDL-TDCs to obtain the nonlinear calibration factors. This method neither adds any system modules nor disrupts the measurement process. Instead, it improves the timeliness of TDL-TDC bin-width calibration in measurement environments featuring significant ambient variations, making it applicable to long-term continuous measurements and reducing measurement uncertainty.
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本文为基于现场可编程门阵列(FPGA)的分接延迟线(TDL)-时间数字转换器(TDC)提出了一种真正的随机校准方法,该方法适用于自发参量下变频(SPDC)系统。在 SPDC 系统中,基于盖革模雪崩光电二极管(GM-APD)的单光子探测器(SPD)信号的泊松分布使 SPD 兼具探测设备和量子随机脉冲发生器(QRPG)的功能,可用于 TDL-TDC 的真实随机码密度校准,从而获得非线性校准因子。这种方法既不会增加任何系统模块,也不会干扰测量过程。相反,它提高了在环境变化较大的测量环境中校准 TDL-TDC 二进制宽度的及时性,使其适用于长期连续测量并降低测量不确定性。
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来源期刊
Measurement
Measurement 工程技术-工程:综合
CiteScore
10.20
自引率
12.50%
发文量
1589
审稿时长
12.1 months
期刊介绍: Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.
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