{"title":"Auxiliary Particle Filtering With Multitudinous Lookahead Sampling for Accurate Target Tracking","authors":"Praveen B. Choppala;Ramoni Adeogun","doi":"10.1109/ACCESS.2025.3548424","DOIUrl":null,"url":null,"abstract":"The auxiliary particle filter, which is the popular extension of the standard bootstrap particle filter, is known to assist in drawing particles from regions of high probability mass of the posterior density by leveraging the incoming measurement information in the sampling process. The filter accomplishes this by looking ahead in time to determine those particles that become important when propagated forward, retract, and then propagate those particles forward in time. The key problem with this approach is that a particle determined to be important may not fall in regions of importance when actually propagated forward, either because of a large diffusion of the state transition kernel and/or a highly informative measurement, thus defeating the entire purpose of the filter. This problem leads to degeneracy. This paper proposes a method of sampling a multitude of particles for each particle to make such a decision. The key idea here is to use multiple disturbances, instead of one as does the auxiliary particle filter, as lookahead means to guide particles to regions of high probability in the posterior probability density. Through evaluation, we show that the proposed idea overcomes the said problem and exhibits less degeneracy and high tracking accuracy.","PeriodicalId":13079,"journal":{"name":"IEEE Access","volume":"13 ","pages":"42874-42886"},"PeriodicalIF":3.4000,"publicationDate":"2025-03-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10910112","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Access","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10910112/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, INFORMATION SYSTEMS","Score":null,"Total":0}
引用次数: 0
Abstract
The auxiliary particle filter, which is the popular extension of the standard bootstrap particle filter, is known to assist in drawing particles from regions of high probability mass of the posterior density by leveraging the incoming measurement information in the sampling process. The filter accomplishes this by looking ahead in time to determine those particles that become important when propagated forward, retract, and then propagate those particles forward in time. The key problem with this approach is that a particle determined to be important may not fall in regions of importance when actually propagated forward, either because of a large diffusion of the state transition kernel and/or a highly informative measurement, thus defeating the entire purpose of the filter. This problem leads to degeneracy. This paper proposes a method of sampling a multitude of particles for each particle to make such a decision. The key idea here is to use multiple disturbances, instead of one as does the auxiliary particle filter, as lookahead means to guide particles to regions of high probability in the posterior probability density. Through evaluation, we show that the proposed idea overcomes the said problem and exhibits less degeneracy and high tracking accuracy.
IEEE AccessCOMPUTER SCIENCE, INFORMATION SYSTEMSENGIN-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
9.80
自引率
7.70%
发文量
6673
审稿时长
6 weeks
期刊介绍:
IEEE Access® is a multidisciplinary, open access (OA), applications-oriented, all-electronic archival journal that continuously presents the results of original research or development across all of IEEE''s fields of interest.
IEEE Access will publish articles that are of high interest to readers, original, technically correct, and clearly presented. Supported by author publication charges (APC), its hallmarks are a rapid peer review and publication process with open access to all readers. Unlike IEEE''s traditional Transactions or Journals, reviews are "binary", in that reviewers will either Accept or Reject an article in the form it is submitted in order to achieve rapid turnaround. Especially encouraged are submissions on:
Multidisciplinary topics, or applications-oriented articles and negative results that do not fit within the scope of IEEE''s traditional journals.
Practical articles discussing new experiments or measurement techniques, interesting solutions to engineering.
Development of new or improved fabrication or manufacturing techniques.
Reviews or survey articles of new or evolving fields oriented to assist others in understanding the new area.