{"title":"The MicroLED Revolution: Advancing Technology Through Metrology and Inspection","authors":"Ian Hendy, Tali Hurvitz, Noam Shapiro","doi":"10.1002/msid.1565","DOIUrl":null,"url":null,"abstract":"<div>\n \n <p>The variable quality of microLED wafers, especially in wavelength and brightness, presents a major challenge for the industry, and high-throughput EL testing could be the solution.</p>\n </div>","PeriodicalId":52450,"journal":{"name":"Information Display","volume":"41 2","pages":"36-41"},"PeriodicalIF":0.0000,"publicationDate":"2025-03-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1002/msid.1565","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Information Display","FirstCategoryId":"1085","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1002/msid.1565","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Engineering","Score":null,"Total":0}
引用次数: 0
Abstract
The variable quality of microLED wafers, especially in wavelength and brightness, presents a major challenge for the industry, and high-throughput EL testing could be the solution.
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