VIS-UV-VUV optical functions of epitaxial ferroelectric PbTiO3/SrTiO3 thin films

IF 3.8 3区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY Optical Materials Pub Date : 2025-03-11 DOI:10.1016/j.optmat.2025.116930
Krzysztof Dorywalski , Nathalie Lemée , Mariem Gharbi , Andreas Zeinert , Paweł Rochowski , Stanisław Pogorzelski , Michał Piasecki
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引用次数: 0

Abstract

Lead titanate PbTiO3 ferroelectric thin films were epitaxially grown by pulsed laser deposition on strontium titanate SrTiO3 substrates. Two samples of thicknesses 117 nm and 313 nm were investigated. The a/c polydomain structure, which results from a partial relaxation of the epitaxial strain, was evidenced in the thicker film. The real and imaginary parts of the complex dielectric function were determined in a broad photon energy range of 2–9.8 eV using spectroscopic ellipsometry. The energy gap values and critical point energies were determined for the both films. An effect of the epitaxy on the optical functions obtained is detected and discussed. The results showed, that even in the case of a relatively small mismatch between the layer and substrate lattice constants, the effect of epitaxy on the optical properties of ferroelectric films is not negligible.
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来源期刊
Optical Materials
Optical Materials 工程技术-材料科学:综合
CiteScore
6.60
自引率
12.80%
发文量
1265
审稿时长
38 days
期刊介绍: Optical Materials has an open access mirror journal Optical Materials: X, sharing the same aims and scope, editorial team, submission system and rigorous peer review. The purpose of Optical Materials is to provide a means of communication and technology transfer between researchers who are interested in materials for potential device applications. The journal publishes original papers and review articles on the design, synthesis, characterisation and applications of optical materials. OPTICAL MATERIALS focuses on: • Optical Properties of Material Systems; • The Materials Aspects of Optical Phenomena; • The Materials Aspects of Devices and Applications. Authors can submit separate research elements describing their data to Data in Brief and methods to Methods X.
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