Structural and transport properties of spray pyrolysed Ce: CdO nanocrystalline thin films for solar cell application

IF 2.5 4区 材料科学 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY Applied Physics A Pub Date : 2025-03-17 DOI:10.1007/s00339-025-08411-3
S. J. Helen, K. Selvakumar, M. Haris
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引用次数: 0

Abstract

In the present study, spray pyrolysis was used to deposit undoped and cerium (Ce) doped cadmium oxide (CdO) thin films with doping concentrations (3, 5 and 7 wt %) films on cleaned glass substrates. The lattice parameter values and crystallite size were determined using X-ray diffraction analysis. The structural, morphological, optical, and electrical properties of the deposited films have been investigated. Scanning electron microscopy analysis reveals that the average grain size and surface morphology of Ce are effectively modified by CdO concentration. The average thickness of the films is estimated using cross-sectional SEM images that revealed that the films had an average thickness of 360 to 480 nm. The energy values for the band gap for 3 to 7 wt% Ce doped CdO thin films are anticipated to have energies between 2.47 and 2.50 eV. The defect-related luminescence is noted by the wideband emission observed (550 to 650 nm) in the PL spectra of CdO thin film. It is reported that 5 wt% Ce-doped CdO thin films have a high conductivity (9.84 × 103 cm− 1) and a low resistivity (1.02 × 10− 6 cm− 1). The results of the photo responsively studies revealed the increase in the photo response with the increasing Ce ions in CdO thin films. The thin films showed photo responsivity up to 70%. Hence, the prepared thin film is suitable for solar cell applications.

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来源期刊
Applied Physics A
Applied Physics A 工程技术-材料科学:综合
CiteScore
4.80
自引率
7.40%
发文量
964
审稿时长
38 days
期刊介绍: Applied Physics A publishes experimental and theoretical investigations in applied physics as regular articles, rapid communications, and invited papers. The distinguished 30-member Board of Editors reflects the interdisciplinary approach of the journal and ensures the highest quality of peer review.
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