{"title":"Effects of Dynamic Diffraction in Coherent X-ray Radiation of Relativistic Electrons in a Periodic Layered Medium","authors":"A. V. Noskov, S. V. Blazhevich, A. V. Konovalenko","doi":"10.1134/S1027451024702252","DOIUrl":null,"url":null,"abstract":"<p>The work is devoted to the study of the possibility of manifestation of the effects of dynamic diffraction of coherent X-ray radiation of relativistic electrons in a periodic layered medium with three layers in a period. Coherent X-ray radiation is considered as a sum of parametric X-ray radiation and diffracted transition radiation. The dynamic theory of coherent X-ray relativistic electrons in the periodic layered medium with three layers in a period is developed. Within the framework of the two-wave approximation of the dynamic theory of diffraction, expressions in real form are obtained that describe the spectral-angular and angular density of radiation. The possibility of manifestation of the effects of dynamic diffraction of coherent X-ray radiation is investigated. The effect of asymmetry of the electron field reflection relative to the target surface on the spectral-angular densities of parametric X-ray and diffracted transition radiation is shown. The possibility of a bright manifestation of the effect of anomalous photoabsorption in parametric X-ray radiation in the considered three-layer structure is shown. This effect is analogous to the well-known Borrmann effect for X-rays in a single crystal.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 1 supplement","pages":"S333 - S342"},"PeriodicalIF":0.4000,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451024702252","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
The work is devoted to the study of the possibility of manifestation of the effects of dynamic diffraction of coherent X-ray radiation of relativistic electrons in a periodic layered medium with three layers in a period. Coherent X-ray radiation is considered as a sum of parametric X-ray radiation and diffracted transition radiation. The dynamic theory of coherent X-ray relativistic electrons in the periodic layered medium with three layers in a period is developed. Within the framework of the two-wave approximation of the dynamic theory of diffraction, expressions in real form are obtained that describe the spectral-angular and angular density of radiation. The possibility of manifestation of the effects of dynamic diffraction of coherent X-ray radiation is investigated. The effect of asymmetry of the electron field reflection relative to the target surface on the spectral-angular densities of parametric X-ray and diffracted transition radiation is shown. The possibility of a bright manifestation of the effect of anomalous photoabsorption in parametric X-ray radiation in the considered three-layer structure is shown. This effect is analogous to the well-known Borrmann effect for X-rays in a single crystal.
期刊介绍：
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
