Fabrication of V2O5/porous silicon heterostructures by simple and low-cost methods, morphological, structural, optical, and electrical characterization, and their first application as photodetectors

IF 4.1 3区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Sensors and Actuators A-physical Pub Date : 2025-03-17 DOI:10.1016/j.sna.2025.116471
A. Garzon-Roman , C.M. Díaz-Barba , D.H. Cuate-Gomez , E. Sanchez-Mora , M.E. de Anda-Reyes , A. Romero-López , C. Zúñiga-Islas , W. Calleja-Arriaga
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Abstract

This research presents the fabrication of heterostructures based on V2O5/porous silicon, their morphological, optical, structural, and electrical characterization, and their application as photodetectors. The fabrication of these heterostructures was performed in one step and with simple and low-cost methods compared to other more complex processes reported in the literature. The porous silicon layers were synthesized using the electrochemical anodization method and the V2O5 structures were obtained with the solvothermal or hydrothermal method, in this step the heterostructures were fabricated. The morphological characterization showed the formation of pores, these pores showed quasi-circular and irregular shapes, an average diameter of about 1.4 μm, and a pore length of around 22 μm perfectly aligned. The morphology of the V2O5 structures showed two morphologies a combination of concentric nanosheets and nanobelts with a thickness between 50 and 100 nm and a length greater than 10 μm for one sample and hollow microspheres with a diameter of about 5 μm for the second sample. The micro-Raman spectra demonstrated the formation of the orthorhombic V2O5 phase due to the Raman signals reported in the literature. X-ray diffraction corroborated the formation of the orthorhombic V2O5 phase, and it was possible to estimate the cell parameters and the size of the crystallites, which were found to be 31.5 and 16.4 nm. The optical characterization by photoluminescence showed main bands centered at 550 nm for the PS and 707 nm for the V2O5 structures. In addition, a passivation effect was observed after the deposition of the V2O5 structures on the porous silicon. Diffuse reflectance spectra together with the Kubelka-Munk method allowed us to estimate the optical bandgap which was 1.5 eV and about 2.1 eV for porous silicon and V2O5, respectively. Finally, electrical characterization under dark and illumination conditions showed rectifying and ohmic behaviors for the heterostructures, and a photocurrent effect was observed in the I-V curves. The photocurrent effect allowed the analysis of the I-t curves, which demonstrated the application of these heterostructures as the simplest photodetectors ever reported.
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来源期刊
Sensors and Actuators A-physical
Sensors and Actuators A-physical 工程技术-工程:电子与电气
CiteScore
8.10
自引率
6.50%
发文量
630
审稿时长
49 days
期刊介绍: Sensors and Actuators A: Physical brings together multidisciplinary interests in one journal entirely devoted to disseminating information on all aspects of research and development of solid-state devices for transducing physical signals. Sensors and Actuators A: Physical regularly publishes original papers, letters to the Editors and from time to time invited review articles within the following device areas: • Fundamentals and Physics, such as: classification of effects, physical effects, measurement theory, modelling of sensors, measurement standards, measurement errors, units and constants, time and frequency measurement. Modeling papers should bring new modeling techniques to the field and be supported by experimental results. • Materials and their Processing, such as: piezoelectric materials, polymers, metal oxides, III-V and II-VI semiconductors, thick and thin films, optical glass fibres, amorphous, polycrystalline and monocrystalline silicon. • Optoelectronic sensors, such as: photovoltaic diodes, photoconductors, photodiodes, phototransistors, positron-sensitive photodetectors, optoisolators, photodiode arrays, charge-coupled devices, light-emitting diodes, injection lasers and liquid-crystal displays. • Mechanical sensors, such as: metallic, thin-film and semiconductor strain gauges, diffused silicon pressure sensors, silicon accelerometers, solid-state displacement transducers, piezo junction devices, piezoelectric field-effect transducers (PiFETs), tunnel-diode strain sensors, surface acoustic wave devices, silicon micromechanical switches, solid-state flow meters and electronic flow controllers. Etc...
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