Chandrashekhar Savant, Thai-Son Nguyen, Kazuki Nomoto, Saurabh Vishwakarma, Siyuan Ma, Akshey Dhar, Yu-Hsin Chen, Joseph Casamento, David J. Smith, Huili Grace Xing, Debdeep Jena
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引用次数: 0
Abstract
We report a polarization-induced 2D electron gas (2DEG) at an epitaxial AlBN/GaN heterojunction grown on a SiC substrate. Using this 2DEG in a long conducting channel, we realize ultra-thin barrier AlBN/GaN high electron mobility transistors that exhibit current densities > 0.25 A/mm, clean current saturation, a low pinch-off voltage of −0.43 V, and a peak transconductance of ∼0.14 S/mm. Transistor performance in this preliminary realization is limited by the contact resistance. Capacitance–voltage measurements reveal that introducing ∼7% B in the epitaxial AlBN barrier on GaN boosts the relative dielectric constant of AlBN to ɛrAlBN∼16, higher than the AlN dielectric constant of ɛrAlN∼9. Epitaxial high-K barrier AlBN/GaN HEMTs can thus extend performance beyond the capabilities of current GaN transistors.
期刊介绍:
Applied Physics Letters (APL) features concise, up-to-date reports on significant new findings in applied physics. Emphasizing rapid dissemination of key data and new physical insights, APL offers prompt publication of new experimental and theoretical papers reporting applications of physics phenomena to all branches of science, engineering, and modern technology.
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