Polynomial Formal Verification of a RISC-V Processor

IF 2.1 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Nanotechnology Pub Date : 2025-03-05 DOI:10.1109/TNANO.2025.3548265
Lennart Weingarten;Kamalika Datta;Rolf Drechsler
{"title":"Polynomial Formal Verification of a RISC-V Processor","authors":"Lennart Weingarten;Kamalika Datta;Rolf Drechsler","doi":"10.1109/TNANO.2025.3548265","DOIUrl":null,"url":null,"abstract":"Verification plays a major role in ensuring the functional correctness of any design. In recent years with growing complexity of processor designs, verification has assumed utmost importance. Simulation-based techniques cannot ensure completeness in verification, and in this regard formal methods prove crucial. Although formal methods guarantee completeness it is hard to quantify the exact time and space complexities. Recently some works have demonstrated that it is possible to achieve polynomial space and time complexities for various arithmetic circuits as well as for processors. In this paper we propose a <italic>Binary Decision Diagram</i> (BDD) based <italic>Polynomial Formal Verification</i> (PFV) approach for verifying processors. As a case study, we discuss the PFV for a multi-cycle processor (viz., MicroRV32) with support for combinational and sequential sub-systems. New data structures and code base are utilized to verify all the functional components. Experimental results reveal that the verification can indeed be performed in polynomial time.","PeriodicalId":449,"journal":{"name":"IEEE Transactions on Nanotechnology","volume":"24 ","pages":"140-151"},"PeriodicalIF":2.1000,"publicationDate":"2025-03-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Nanotechnology","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10912080/","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

Abstract

Verification plays a major role in ensuring the functional correctness of any design. In recent years with growing complexity of processor designs, verification has assumed utmost importance. Simulation-based techniques cannot ensure completeness in verification, and in this regard formal methods prove crucial. Although formal methods guarantee completeness it is hard to quantify the exact time and space complexities. Recently some works have demonstrated that it is possible to achieve polynomial space and time complexities for various arithmetic circuits as well as for processors. In this paper we propose a Binary Decision Diagram (BDD) based Polynomial Formal Verification (PFV) approach for verifying processors. As a case study, we discuss the PFV for a multi-cycle processor (viz., MicroRV32) with support for combinational and sequential sub-systems. New data structures and code base are utilized to verify all the functional components. Experimental results reveal that the verification can indeed be performed in polynomial time.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
验证在确保任何设计的功能正确性方面都发挥着重要作用。近年来,随着处理器设计的复杂性不断增加,验证变得极为重要。基于仿真的技术无法确保验证的完整性,在这方面,形式化方法被证明是至关重要的。虽然形式化方法能保证完整性,但很难量化确切的时间和空间复杂性。最近的一些研究表明,各种算术电路和处理器都有可能实现多项式空间和时间复杂性。在本文中,我们提出了一种基于二进制判定图(BDD)的多项式形式化验证(PFV)方法,用于验证处理器。作为案例研究,我们讨论了支持组合和顺序子系统的多周期处理器(即 MicroRV32)的 PFV。新的数据结构和代码库用于验证所有功能组件。实验结果表明,验证确实可以在多项式时间内完成。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
IEEE Transactions on Nanotechnology
IEEE Transactions on Nanotechnology 工程技术-材料科学:综合
CiteScore
4.80
自引率
8.30%
发文量
74
审稿时长
8.3 months
期刊介绍: The IEEE Transactions on Nanotechnology is devoted to the publication of manuscripts of archival value in the general area of nanotechnology, which is rapidly emerging as one of the fastest growing and most promising new technological developments for the next generation and beyond.
期刊最新文献
Polynomial Formal Verification of a RISC-V Processor Effects of 3D Channel Shape on the Performance of Nanoscale Gate-All-Around FETs Influence of Temperature, Strain Rate, and Vacancies on the Mechanical Properties of Aluminum-Doped Bilayer Silicene Dynamic Analysis of the Effect of the Device-to-Device Variability of Real-World Memristors on the Implementation of Uncoupled Memristive Cellular Nonlinear Networks Ti-Doped ZnO Nanowires: A Breakthrough in Non-Volatile Resistive Memory Application
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1