Jixiang Jing;Yumeng Luo;Yicheng Wang;Zhongqiang Wang;Qi Wang;Kwai Hei Li;Zhiqin Chu
{"title":"Strain-Enhanced Responsivity of Scalable and Flexible Diamond UV Detector","authors":"Jixiang Jing;Yumeng Luo;Yicheng Wang;Zhongqiang Wang;Qi Wang;Kwai Hei Li;Zhiqin Chu","doi":"10.1109/LED.2025.3535477","DOIUrl":null,"url":null,"abstract":"In this letter, we present scalable and flexible diamond UV detectors. A 2-inch, 1-<inline-formula> <tex-math>$\\mu $ </tex-math></inline-formula>m-thick diamond film is exfoliated from its heteroepitaxial silicon substrate and transferred to a soft PDMS substrate, forming the foundation for the flexible detector. Measurement under strains of 0%, 0.6%, and 1.2% reveals a decrease in the bandgap of diamond film from 5.31 eV to 5.18 eV and 5.06 eV, respectively. This strain-induced narrowing of the bandgap improves the responsivity of diamond detectors under UV illumination. The elastic strain engineering on diamonds, being simple and effective, provides a new route to improve the performance of diamond UV detectors, promising to accelerate the development of next-generation flexible diamond electronics.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"46 4","pages":"541-544"},"PeriodicalIF":4.5000,"publicationDate":"2025-01-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10855628/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
In this letter, we present scalable and flexible diamond UV detectors. A 2-inch, 1-$\mu $ m-thick diamond film is exfoliated from its heteroepitaxial silicon substrate and transferred to a soft PDMS substrate, forming the foundation for the flexible detector. Measurement under strains of 0%, 0.6%, and 1.2% reveals a decrease in the bandgap of diamond film from 5.31 eV to 5.18 eV and 5.06 eV, respectively. This strain-induced narrowing of the bandgap improves the responsivity of diamond detectors under UV illumination. The elastic strain engineering on diamonds, being simple and effective, provides a new route to improve the performance of diamond UV detectors, promising to accelerate the development of next-generation flexible diamond electronics.
期刊介绍：
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
