{"title":"Enhancing the thermoelectric power factor of metal/tetrahedrite nanocomposites via phase boundary engineering","authors":"Oleksandr Dobrozhan , Roman Pshenychnyi , Oleksii Klymov , Maksym Yermakov , Bohdan Boiko , Saїd Agouram , Vicente Muñoz-Sanjosé , Anatoliy Opanasyuk","doi":"10.1016/j.mssp.2025.109548","DOIUrl":null,"url":null,"abstract":"<div><div>Tetrahedrite is an important thermoelectric material due to its low lattice thermal conductivity (<em>κ</em><sub>l</sub>) and relatively high figure-of-merit (<em>zT</em><sub>max</sub>). Further enhancement of <em>zT</em> parameter is expected through the enhancement of the power factor (<em>PF</em>) by decoupling the interdependence between electrical conductivity (<em>σ</em>) and Seebeck coefficient (<em>S</em>). In order to do that, in this work, we propose to act on the phase boundaries of the tetrahedrite (Cu<sub>12</sub>Sb<sub>4</sub>S<sub>13</sub>) composites with metal (Ag, Ni) nanoinclusions. These composites, with nominal metal compositions of <em>x</em> = (0.0, 0.5, 1.0, 2.0, 4.0) wt. %, were synthesized by a solution-based bottom–up approach. The structure and microstructure of the Cu<sub>12</sub>Sb<sub>4</sub>S<sub>13</sub>–[Ag, Ni] composites were characterized using X-ray diffraction, scanning electron microscopy, high-resolution transmission electron microscopy, and energy dispersive X-ray analysis. The charge carrier transport and its scattering mechanisms were investigated by examining the <em>σ</em>–<em>T</em> and <em>S</em>–<em>T</em> dependencies, followed by calculations of the maximum power factor (<em>PF</em><sub>max</sub>), average power factor (<em>PF</em><sub>avg</sub>), electronic thermal conductivity (<em>κ</em><sub>e</sub>), weighted mobility (<em>μ</em><sub>w</sub>), potential energy barrier (<em>E</em><sub>b</sub>), and electronic quality factor (<em>B</em><sub>E</sub>). In Ag-based composites, the <em>PF</em><sub>avg</sub> improved in respect to the tetrahedrite matrix by ∼20 % in the temperature range of 298–413 K at <em>x</em><sub>Ag</sub> = 0.5 and 1.0 wt % due to the charge carrier filtering through Schottky barriers at the Ag/Cu<sub>12</sub>Sb<sub>4</sub>S<sub>13</sub> interfaces. In Ni-based composites, the <em>PF</em><sub>avg</sub> increased by ∼15 % in the same temperature range for <em>x</em><sub>Ni</sub> = 0.5 wt % as a result of the charge carrier accumulation (modulation doping) facilitated by Ohmic barriers at the Ni/Cu<sub>12</sub>Sb<sub>4</sub>S<sub>13</sub> interfaces.</div></div>","PeriodicalId":18240,"journal":{"name":"Materials Science in Semiconductor Processing","volume":"194 ","pages":"Article 109548"},"PeriodicalIF":4.6000,"publicationDate":"2025-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials Science in Semiconductor Processing","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1369800125002859","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Tetrahedrite is an important thermoelectric material due to its low lattice thermal conductivity (κl) and relatively high figure-of-merit (zTmax). Further enhancement of zT parameter is expected through the enhancement of the power factor (PF) by decoupling the interdependence between electrical conductivity (σ) and Seebeck coefficient (S). In order to do that, in this work, we propose to act on the phase boundaries of the tetrahedrite (Cu12Sb4S13) composites with metal (Ag, Ni) nanoinclusions. These composites, with nominal metal compositions of x = (0.0, 0.5, 1.0, 2.0, 4.0) wt. %, were synthesized by a solution-based bottom–up approach. The structure and microstructure of the Cu12Sb4S13–[Ag, Ni] composites were characterized using X-ray diffraction, scanning electron microscopy, high-resolution transmission electron microscopy, and energy dispersive X-ray analysis. The charge carrier transport and its scattering mechanisms were investigated by examining the σ–T and S–T dependencies, followed by calculations of the maximum power factor (PFmax), average power factor (PFavg), electronic thermal conductivity (κe), weighted mobility (μw), potential energy barrier (Eb), and electronic quality factor (BE). In Ag-based composites, the PFavg improved in respect to the tetrahedrite matrix by ∼20 % in the temperature range of 298–413 K at xAg = 0.5 and 1.0 wt % due to the charge carrier filtering through Schottky barriers at the Ag/Cu12Sb4S13 interfaces. In Ni-based composites, the PFavg increased by ∼15 % in the same temperature range for xNi = 0.5 wt % as a result of the charge carrier accumulation (modulation doping) facilitated by Ohmic barriers at the Ni/Cu12Sb4S13 interfaces.
期刊介绍:
Materials Science in Semiconductor Processing provides a unique forum for the discussion of novel processing, applications and theoretical studies of functional materials and devices for (opto)electronics, sensors, detectors, biotechnology and green energy.
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