Exploring the elemental detection on portable XRF vs SEM-EDX in household alloy materials analysis

Abstract

This study assesses the efficacy of portable X-ray Fluorescence (XRF) and Scanning Electron Microscopy with Energy Dispersive X-ray (SEM-EDX) for determining the elemental compositions of household alloy materials. Fifteen different alloy samples were examined employing both techniques. To evaluate the detection capabilities and agreement between the two techniques, statistical studies were performed, involving paired t-tests and Bland-Altman analysis. The findings revealed that XRF detected a significantly higher number of elements per sample (mean: 7.33) compared to SEM-EDX (mean: 2.87), with a statistically significant mean difference (p < 0.05). The Bland-Altman analysis demonstrated a mean bias of −4.47, with limits of agreement ranging from −11.76 to 2.82, highlighting variability in detection performance. XRF exhibited enhanced bulk analytical proficiency, effectively identifying both trace and major components, whereas SEM-EDX excelled in surface-specific analysis and spatial resolution. The results highlight the synergistic characteristics of various approaches, indicating their combined application for comprehensive elemental investigation. These findings are especially noteworthy for forensic and industrial applications requiring accurate material assessment.