Photoresponse Evaluation of a Multiband Self-Driven SnO2/CuO/Si Heterojunction Photodetector Fabricated by Pulsed Laser Deposition

IF 4.7 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2025-04-03 DOI:10.1021/acsaelm.5c00118
Sabreen A. Khalaf, Ethar Yahya Salih*, Asmiet Ramizy, Raid A. Ismail and Mustafa K. A. Mohammed*, 
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Abstract

In this Article, a systematic multiband (p-n and n-p-n) analysis of a self-powered SnO2/CuO/Si heterojunction photodetector was conducted, considering both incident wavelength and light intensity episodes. Furthermore, the microstructural and optical features of the acquired layers were examined. The topography investigations revealed that the average diameters of the nanoparticles were 43.3 and 57.9 nm for the CuO and SnO2 films, respectively, with corresponding optical bandgaps of 1.98 and 3.75 eV. Additionally, the investigated junctions (n-SnO2/n-Si, p-CuO/n-Si, and n-SnO2/p-CuO) demonstrated distinguished figure-of-merits at zero bias voltage, highlighting the self-driven nature of the proposed geometry over the scanned wavelength range. Two primary driving bands were observed at 340 and 625 nm. Particularly, the n-SnO2/p-CuO structure exhibited a responsivity (Rλ) of 19.37 mA/W and a specific detectivity (D*) of 7.1 × 1011 Jones at 625 nm and 25.3 μW/cm2; these values decreased at 340 nm. The proposed structures also showed reduced figure-of-merits at higher incident light intensities, with an Rλ of 8.9 mA/W and a D* of 3.2 × 1011 Jones observed for the addressed junction at 67.8 μW/cm2. The time-resolved profile indicated fast response and recovery times (τRF) of 190 and 250 ms, respectively. An energy-band diagram of a SnO2/CuO heterojunction photodetector under incident light was also proposed.

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脉冲激光沉积多波段自驱动SnO2/CuO/Si异质结光电探测器的光响应评价
本文在考虑入射波长和光强的情况下,对自供电的SnO2/CuO/Si异质结光电探测器进行了系统的多波段(p-n和n-p-n)分析。此外,还对制备层的显微结构和光学特征进行了研究。形貌研究表明,CuO和SnO2薄膜的平均直径分别为43.3和57.9 nm,相应的光学带隙分别为1.98和3.75 eV。此外,所研究的结(n-SnO2/n-Si, p-CuO/n-Si和n-SnO2/p-CuO)在零偏置电压下表现出优异的性能,突出了所提出的几何形状在扫描波长范围内的自驱动性质。在340 nm和625 nm处观察到两个主要驱动带。其中,n-SnO2/p-CuO结构在625 nm和25.3 μW/cm2处的响应率(Rλ)为19.37 mA/W,比探测率(D*)为7.1 × 1011 Jones;这些值在340 nm处下降。在较高的入射光强度下,所提出的结构也显示出较低的优点系数,在67.8 μW/cm2下,寻址结的Rλ为8.9 mA/W, D*为3.2 × 1011 Jones。时间分辨曲线显示快速响应和恢复时间(τR/τF)分别为190 ms和250 ms。给出了SnO2/CuO异质结光电探测器在入射光作用下的能带图。
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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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