Enhanced Heterodyne Grating Interferometer for Simultaneously Measuring Tri-Axial Linear Motions

IF 5.9 2区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Instrumentation and Measurement Pub Date : 2025-04-02 DOI:10.1109/TIM.2025.3557115
Xingyou Chen;Peng Huang;Limin Zhu;Zhiwei Zhu
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Abstract

A novel heterodyne grating interferometer (HTGI) with a rotationally symmetric optical configuration is proposed to achieve the simultaneous measurement of tri-axial linear motions with a large Z-axis range and a large Z-axis rotation tolerance. In this design, the ±1st-order diffracted beams from one incident beam were purposely rotated around the central axis by an angle of 180° to interfere with them from the other incident beam. In this configuration, all beams can shift identical distances along the same direction to maintain interference, when the grating has large Z-axis motions and rotations. Experimental testing demonstrates high linearities comparable with commercial capacitive sensors, and sub-nanometric resolutions by identifying 0.25 nm motions via the spectrum analysis for all the tri-axial measurements. Moreover, a greatly extended Z-axis range of 7.6 mm and a Z-axis rotation tolerance of 0.75° were achieved, well demonstrating the superiority of the proposed design.
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同时测量三轴直线运动的增强型外差光栅干涉仪
提出了一种旋转对称光学结构的外差光栅干涉仪(HTGI),可同时测量大z轴范围和大z轴旋转公差的三轴直线运动。在这个设计中,来自一个入射光束的±一阶衍射光束故意绕中心轴旋转180°,以干扰来自另一个入射光束的±一阶衍射光束。在这种结构中,当光栅有较大的z轴运动和旋转时,所有光束可以沿着同一方向移动相同的距离以保持干涉。实验测试表明,该传感器具有与商用电容式传感器相当的高线性度,并且通过对所有三轴测量的频谱分析识别0.25 nm运动,具有亚纳米分辨率。此外,还实现了极大地扩展了7.6 mm的z轴范围和0.75°的z轴旋转公差,充分证明了所提出设计的优越性。
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来源期刊
IEEE Transactions on Instrumentation and Measurement
IEEE Transactions on Instrumentation and Measurement 工程技术-工程:电子与电气
CiteScore
9.00
自引率
23.20%
发文量
1294
审稿时长
3.9 months
期刊介绍: Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.
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