Environmental control for X-ray nanotomography.

IF 2.4 3区 物理与天体物理 Q2 INSTRUMENTS & INSTRUMENTATION Journal of Synchrotron Radiation Pub Date : 2022-09-01 Epub Date: 2022-07-21 DOI:10.1107/S1600577522006968
Mirko Holler, Tomas Aidukas, Lars Heller, Christian Appel, Nicholas W Phillips, Elisabeth Müller-Gubler, Manuel Guizar-Sicairos, Jörg Raabe, Johannes Ihli
{"title":"Environmental control for X-ray nanotomography.","authors":"Mirko Holler, Tomas Aidukas, Lars Heller, Christian Appel, Nicholas W Phillips, Elisabeth Müller-Gubler, Manuel Guizar-Sicairos, Jörg Raabe, Johannes Ihli","doi":"10.1107/S1600577522006968","DOIUrl":null,"url":null,"abstract":"<p><p>The acquisition speed and spatial resolution of X-ray nanotomography have continuously improved over the last decades. Coherent diffraction-based techniques breach the 10 nm resolution barrier frequently and thus pose stringent demands on sample positioning accuracy and stability. At the same time there is an increasing desire to accommodate in situ or operando measurements. Here, an environmental control system for X-ray nanotomography is introduced to regulate the temperature of a sample from room temperature up to 850°C in a controlled atmospheric composition. The system allows for a 360° sample rotation, permitting tomographic studies in situ or operando free of missing wedge constraints. The system is implemented and available at the flOMNI microscope at the Swiss Light Source. In addition to the environmental control system itself, the related modifications of flOMNI are described. Tomographic measurements of a nanoporous gold sample at 50°C and 600°C at a resolution of sub-20 nm demonstrate the performance of the device.</p>","PeriodicalId":17114,"journal":{"name":"Journal of Synchrotron Radiation","volume":"29 Pt 5","pages":"1223-1231"},"PeriodicalIF":2.4000,"publicationDate":"2022-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9455200/pdf/","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Synchrotron Radiation","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1107/S1600577522006968","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2022/7/21 0:00:00","PubModel":"Epub","JCR":"Q2","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
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Abstract

The acquisition speed and spatial resolution of X-ray nanotomography have continuously improved over the last decades. Coherent diffraction-based techniques breach the 10 nm resolution barrier frequently and thus pose stringent demands on sample positioning accuracy and stability. At the same time there is an increasing desire to accommodate in situ or operando measurements. Here, an environmental control system for X-ray nanotomography is introduced to regulate the temperature of a sample from room temperature up to 850°C in a controlled atmospheric composition. The system allows for a 360° sample rotation, permitting tomographic studies in situ or operando free of missing wedge constraints. The system is implemented and available at the flOMNI microscope at the Swiss Light Source. In addition to the environmental control system itself, the related modifications of flOMNI are described. Tomographic measurements of a nanoporous gold sample at 50°C and 600°C at a resolution of sub-20 nm demonstrate the performance of the device.

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X 射线纳米层析技术的环境控制。
过去几十年来,X 射线纳米层析技术的采集速度和空间分辨率不断提高。基于相干衍射的技术经常突破 10 纳米分辨率的障碍,因此对样品定位的准确性和稳定性提出了严格的要求。与此同时,人们对原位或操作测量的要求也越来越高。这里介绍一种用于 X 射线纳米层析成像的环境控制系统,可在可控的大气成分中将样品的温度从室温调节到 850°C。该系统允许样品 360° 旋转,从而使断层扫描研究不受楔形缺失的限制。该系统已在瑞士光源的 flOMNI 显微镜上实施并投入使用。除了环境控制系统本身,还介绍了对 flOMNI 进行的相关改造。在50°C和600°C条件下,以低于20纳米的分辨率对纳米多孔金样品进行的断层扫描测量证明了该设备的性能。
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来源期刊
CiteScore
5.10
自引率
12.00%
发文量
289
审稿时长
4-8 weeks
期刊介绍: Synchrotron radiation research is rapidly expanding with many new sources of radiation being created globally. Synchrotron radiation plays a leading role in pure science and in emerging technologies. The Journal of Synchrotron Radiation provides comprehensive coverage of the entire field of synchrotron radiation and free-electron laser research including instrumentation, theory, computing and scientific applications in areas such as biology, nanoscience and materials science. Rapid publication ensures an up-to-date information resource for scientists and engineers in the field.
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