Quantitative analysis of retained austenite in Nb added Fe-based alloy

Q3 Immunology and Microbiology Applied Microscopy Pub Date : 2022-06-18 DOI:10.1186/s42649-022-00074-1
Kwang Kyu Ko, Jin Ho Jang, Saurabh Tiwari, Hyo Ju Bae, Hyo Kyung Sung, Jung Gi Kim, Jae Bok Seol
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引用次数: 2

Abstract

The use of Pipelines for long-distance transportation of crude oil, natural gas and similar applications is increasing and has pivotal importance in recent times. High specific strength plays a crucial role in improving transport efficiency through increased pressure and improved laying efficiency through reduced diameter and weight of line pipes. TRIP-based high-strength and high-ductility alloys comprise a mixture of ferrite, bainite, and retained austenite that provide excellent mechanical properties such as dimensional stability, fatigue strength, and impact toughness. This study performs microstructure analysis using both Nital etching and LePera etching methods. At the time of Nital etching, it is difficult to distinctly observe second phase. However, using LePera etching conditions it is possible to distinctly measure the M/A phase and ferrite matrix. The fraction measurement was done using OM and SEM images which give similar results for the average volume fraction of the phases. Although it is possible to distinguish the M/A phase from the SEM image of the sample subjected to LePera etching. However, using Nital etching is nearly impossible. Nital etching is good at specific phase analysis than LePera etching when using SEM images.

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加Nb铁基合金中残余奥氏体的定量分析
在原油、天然气和类似应用的长距离运输中,管道的使用越来越多,近年来具有举足轻重的重要性。高比强度通过增加压力来提高输送效率,通过减小管线管径和重量来提高敷设效率,具有至关重要的作用。基于trip的高强度和高延展性合金由铁素体、贝氏体和残余奥氏体的混合物组成,具有优异的机械性能,如尺寸稳定性、疲劳强度和冲击韧性。本研究使用Nital蚀刻和LePera蚀刻方法进行微观结构分析。在初始蚀刻时,很难清晰地观察到第二相。然而,使用LePera蚀刻条件,可以清楚地测量M/A相和铁氧体基体。分数测量是用OM和SEM图像完成的,它们对相的平均体积分数给出了相似的结果。虽然可以从LePera蚀刻样品的SEM图像中区分M/A相。然而,使用Nital蚀刻几乎是不可能的。当使用SEM图像时,Nital蚀刻比LePera蚀刻具有更好的比相分析能力。
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来源期刊
Applied Microscopy
Applied Microscopy Immunology and Microbiology-Applied Microbiology and Biotechnology
CiteScore
3.40
自引率
0.00%
发文量
10
审稿时长
10 weeks
期刊介绍: Applied Microscopy is a peer-reviewed journal sponsored by the Korean Society of Microscopy. The journal covers all the interdisciplinary fields of technological developments in new microscopy methods and instrumentation and their applications to biological or materials science for determining structure and chemistry. ISSN: 22875123, 22874445.
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