Study on the CM EMI Generation Characteristics of the Si/SiC Hybrid Switch at Different Switching Patterns and Gate Resistors

IF 1.9 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Frontiers in electronics Pub Date : 2022-03-21 DOI:10.3389/felec.2021.789902
Yong Zhu, Zishun Peng, Yuxing Dai, Zhenxing Zhao, Zeng Liu, Zijie Zheng
{"title":"Study on the CM EMI Generation Characteristics of the Si/SiC Hybrid Switch at Different Switching Patterns and Gate Resistors","authors":"Yong Zhu, Zishun Peng, Yuxing Dai, Zhenxing Zhao, Zeng Liu, Zijie Zheng","doi":"10.3389/felec.2021.789902","DOIUrl":null,"url":null,"abstract":"The switching patterns and gate resistor of the Si/SiC hybrid switch are the key to realizing its own highly efficient and reliable operation. However, as an important performance indicator, the common mode (CM) electromagnetic interference (EMI) noise caused by the Si/SiC hybrid switch lacks comprehensive research, which means that it is not clear how the switching patterns and gate resistor affect CM EMI. In this paper, the Si/SiC hybrid switch-based boost converter is established at first. Then, by analyzing the spectral characteristics of the CM voltage of the Si/SiC hybrid switch, the CM EMI generation characteristics of the Si/SiC hybrid switch at different switching patterns and gate resistors are revealed. Furthermore, the analysis and experimental results can be used to comprehensively guide the design of the gate drive pattern, gate resistor, and EMI suppression strategy.","PeriodicalId":73081,"journal":{"name":"Frontiers in electronics","volume":null,"pages":null},"PeriodicalIF":1.9000,"publicationDate":"2022-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Frontiers in electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3389/felec.2021.789902","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
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Abstract

The switching patterns and gate resistor of the Si/SiC hybrid switch are the key to realizing its own highly efficient and reliable operation. However, as an important performance indicator, the common mode (CM) electromagnetic interference (EMI) noise caused by the Si/SiC hybrid switch lacks comprehensive research, which means that it is not clear how the switching patterns and gate resistor affect CM EMI. In this paper, the Si/SiC hybrid switch-based boost converter is established at first. Then, by analyzing the spectral characteristics of the CM voltage of the Si/SiC hybrid switch, the CM EMI generation characteristics of the Si/SiC hybrid switch at different switching patterns and gate resistors are revealed. Furthermore, the analysis and experimental results can be used to comprehensively guide the design of the gate drive pattern, gate resistor, and EMI suppression strategy.
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Si/SiC混合开关在不同开关模式和栅极电阻下的CM - EMI产生特性研究
硅/碳化硅混合开关的开关方式和栅极电阻是实现其自身高效可靠运行的关键。然而,作为一项重要的性能指标,Si/SiC混合开关引起的共模(CM)电磁干扰(EMI)噪声缺乏全面的研究,这意味着开关方式和栅极电阻对CM EMI的影响尚不清楚。本文首先建立了基于Si/SiC混合开关的升压变换器。然后,通过分析Si/SiC混合开关CM电压的频谱特性,揭示了Si/SiC混合开关在不同开关方式和栅极电阻下的CM电磁干扰产生特性。此外,分析和实验结果可用于全面指导栅极驱动模式、栅极电阻和电磁干扰抑制策略的设计。
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