Physics Based RTD Model Accounting for Space Charge and Phonon Scattering Effects

Daniel R. Celino, Adelcio M de Souza, Caio Luiz Machado Pereira Plazas, R. Ragi, Murilo A Romero
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引用次数: 1

Abstract

This paper presents a fully analytical model for the current-voltage (I–V) characteristics of Resonant Tunneling Diodes. Based on Tsu-Esaki formalism, we consider the full electrical potential distribution in the structure, including the space charge regions at the emitter and collector layers. In addition, we account for the scattering suffered by carriers when tunneling through the double-barrier region, as a function of the applied bias voltage. These considerations improve the accuracy of the proposed model when compared with other approaches while keeping it physics based and fully analytical. Finally, the model is validated with experimental and numericaldata, demonstrating its feasibility for applications in circuit simulation environments.
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考虑空间电荷和声子散射效应的基于物理的RTD模型
本文提出了谐振隧道二极管电流-电压(I–V)特性的全解析模型。基于Tsu Esaki形式,我们考虑了结构中的全电势分布,包括发射极和集电极层的空间电荷区。此外,我们考虑了载流子在隧穿双势垒区时所遭受的散射,作为所施加偏置电压的函数。与其他方法相比,这些考虑因素提高了所提出模型的准确性,同时保持了其物理基础和充分的分析性。最后,通过实验和数值数据对该模型进行了验证,证明了其在电路仿真环境中应用的可行性。
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来源期刊
Journal of Integrated Circuits and Systems
Journal of Integrated Circuits and Systems Engineering-Electrical and Electronic Engineering
CiteScore
0.90
自引率
0.00%
发文量
39
期刊介绍: This journal will present state-of-art papers on Integrated Circuits and Systems. It is an effort of both Brazilian Microelectronics Society - SBMicro and Brazilian Computer Society - SBC to create a new scientific journal covering Process and Materials, Device and Characterization, Design, Test and CAD of Integrated Circuits and Systems. The Journal of Integrated Circuits and Systems is published through Special Issues on subjects to be defined by the Editorial Board. Special issues will publish selected papers from both Brazilian Societies annual conferences, SBCCI - Symposium on Integrated Circuits and Systems and SBMicro - Symposium on Microelectronics Technology and Devices.
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