Hierarchical Structure of SiO2 by In Situ Modification Combining Quartz Sand and Methyltrimethoxysilane

Q4 Physics and Astronomy Defect and Diffusion Forum Pub Date : 2023-08-22 DOI:10.4028/p-2jVrNK
L. Silvia, Lana Awathifi, Yuniar Mughayyirah, M. Zainuri, D. Darminto
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Abstract

SiO2 were successfully synthesized by sol–gel process via in-situ modification. The SiO2 consists of two kinds of co-precursor namely raw material from quartz sand and methyltrimethoxysilane (MTMS) as main SiO2 source. By introducing SiO2 with different sizes of particle micro-submicron scale, it was suggested to construct hierarchical structure. The sample was characterized by X-Ray Diffraction (XRD), Scanning Electron Microscope (SEM), and Atomic Force Microscope (AFM) to analyze crystal structure, morphology of particles, and surface roughness of the samples. In this research, SiO2 co-precursor from quartz sand were extraction and synthesis to be SiO2 quartz (SQ) phase and SiO2 amorphous (SA) phase respectively which is combine with SiO2 based MTMS by sol–gel process via in-situ modification. Based on the results, it can be concluded that SiO2 with high purity levels maintains its crystal structure even after in-situ modification, resulting in an increase in particle size to approximately 12-20 μm. SEM images showed that particle was irregular shape due to agglomeration which is SiO2 based quartz sand stick by SiO2 based MTMS. AFM showed the surface roughness of MTMS/SQ have a larger roughness than MTMS/SA with Sa 3.3 ± 0.8 nm and Sq 5.0 ± 1.0 nm. The formation of hierarchical structure layers based on SiO2 has a promising potential for wide applications in various fields such as hydrophobic surface.
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石英砂与甲基三甲氧基硅烷原位改性SiO2的层次结构研究
通过原位改性,采用溶胶-凝胶法制备了SiO2。SiO2由石英砂原料和以甲基三甲氧基硅烷(MTMS)为主要SiO2源的两种共前驱体组成。通过引入不同粒径的SiO2颗粒,提出构建层次化结构。采用x射线衍射(XRD)、扫描电镜(SEM)和原子力显微镜(AFM)对样品进行了表征,分析了样品的晶体结构、颗粒形貌和表面粗糙度。本研究从石英砂中提取SiO2共前驱体,分别合成SiO2石英(SQ)相和SiO2非晶(SA)相,通过原位改性,采用溶胶-凝胶法与SiO2基MTMS结合。结果表明,高纯度SiO2在原位改性后仍保持了原有的晶体结构,晶粒尺寸增大到12 ~ 20 μm左右。SEM图像显示,颗粒因团聚而呈不规则形状,为SiO2基石英砂经SiO2基MTMS粘接而成。AFM结果表明,MTMS/SQ的表面粗糙度比MTMS/SA大,SA为3.3±0.8 nm, SQ为5.0±1.0 nm。基于SiO2的分层结构层的形成在疏水表面等各个领域具有广阔的应用前景。
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来源期刊
Defect and Diffusion Forum
Defect and Diffusion Forum Physics and Astronomy-Radiation
CiteScore
1.20
自引率
0.00%
发文量
127
期刊介绍: Defect and Diffusion Forum (formerly Part A of ''''Diffusion and Defect Data'''') is designed for publication of up-to-date scientific research and applied aspects in the area of formation and dissemination of defects in solid materials, including the phenomena of diffusion. In addition to the traditional topic of mass diffusion, the journal is open to papers from the area of heat transfer in solids, liquids and gases, materials and substances. All papers are peer-reviewed and edited. Members of Editorial Boards and Associate Editors are invited to submit papers for publication in “Defect and Diffusion Forum” . Authors retain the right to publish an extended and significantly updated version in another periodical.
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